Test Ports - Toshiba TC9314F Manual

Cmos digital integrated circuit silicon monolithic
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2. MUTE Output Structure and Timing
Note 68: When using the phase difference output by the phase comparator, externally connect a low-pass filter
to the MUTE output.

Test Ports

These are internal ports for testing the device's functions. Access the ports by executing the OUT1 instruction
with the operand [C
= FH], or the OUT2 instruction with the operands [C
N
normally set to "0" by software.
Note 69: The ports are reset to "0" after a system reset.
Using as an Evaluator Chip
When a high voltage is supplied to the TEST pin (TEST mode), the device functions as an evaluator chip.
Three test modes are supported. Use three devices to configure a software development tool.
Connecting this software development tool and a tuner IC enables you to check radio operations while
developing software.
For the development tool specifications, refer to the TC9314F software development tool specification sheet.
Note 67: When POL bit = 0
= 7H] or [C
N
60
TC9314F
= FFH]. The ports are
N
2003-07-03

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