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User's Guide
ADCxxDJxx00RF/SE Evaluation Module
The ADCxxDJxx00RFEVM/SEEVM is an evaluation board used to evaluate the ADC12DJ5200RF,
ADC12DJ4000RF, ADC08DJ5200RF, ADC12DJ5200SE analog-to-digital converters (ADC) from Texas
Instruments. The ADC12DJ5200RF and SE is a dual-channel, 12/08-bit ADC, capable of operating at sampling
rates up to 5.2 and 4 Giga-samples per second (GSPS) in dual-channel mode, or 10.4 and 8 GSPS in single-
channel mode. The ADC12DJ5200RF/SE, ADC12DJ4000RF, ADC08DJ5200RF output data is transmitted over
a standard JESD204C high-speed serial interface. This evaluation board also includes the following important
features:
•
Transformer-coupled signal input network allowing a single-ended signal source from 500 kHz to
9 GHz. ADC12DJ5200SE has an internal balun in the ADC chip.
•
The LMX2594 clock synthesizer generates the ADC sampling clock
•
The LMK04828, LMK61E2 and LMX2594 onboard system clock generator generates SYSREF and FPGA
reference clocks for the high-speed serial interface
•
Transformer-coupled clock input network to test the ADC performance with an external low-noise clock
source
•
LM95233 temperature sensor
•
High-speed serial data output over a High Pin Count FMC+ interface connector
To improve signal routing quality, serial lane polarity is inverted with respect to the standard FMC
VITA-57 signal mapping. Signal mapping and polarity is shown in
•
Device register programming through USB connector and FTDI USB-to-SPI bus translator
SLAU640B – APRIL 2019 – REVISED MARCH 2023
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ABSTRACT
Note
Copyright © 2023 Texas Instruments Incorporated
Table
8-1).
ADCxxDJxx00RF/SE Evaluation Module
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