Factory Test Input; Tas Ate Enable Input; Tas Built In Test Equipment (Bite) - Honeywell BENDIX KING KMH 880 System Installation Manual

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B B
3.1.12

Factory Test Input

When active, the EGPWS will go into the Factory Test Mode. The TAS Proces-
sor and the Automatic Test Equipment will interface via RS-232 and the ATE
Test Pins.
J10-113 GSE_PRES# (Factory Test) (Factory Only)
3.1.12.1

TAS ATE Enable Input

The ATE Enable is used to enable the ATE lines for the Anechoic Chamber and
the RGS stations. The TAS Automated Test Equipment will fully test the TAS
system closing the loop around the TAS antenna system by emulating the
functions of an intruder aircraft.
3.1.12.2

TAS Built In Test Equipment (BITE)

BITE enables the TAS Processor to provide internal system performance mon-
itoring under normal bench conditions, under environmental extremes and dur-
ing normal operation. All BITE functions are an integral part of the normal
operational TAS system and do not interfere with normal TAS operations. The
TAS Processor BITE function is responsible for executing the test outlined
below (during cold start or functional test) to ensure that the TAS Processor
and inputs from interfacing components are functional.
1. Automatic System Performance Monitoring (SPM) and Functional Test
The TAS Processor SPM and functional test functions will test the TAS Pro-
cessor for correct operation (detection of internal faults) and test inputs
provided by external system components for correct operation (detection of
external faults). The SPM function and functional test are capable of
detecting and initiating the appropriate response to all faults that would
affect the ability of the TAS Processor to meet TAS system safety and per-
formance requirements.
System Performance Monitoring is performed on a continuous basis. The
tests outlined below are accomplished to ensure correct operation of the
TAS Processor and interfacing components during normal operation.
The purpose of the TAS Processor automatic system performance
monitoring (SPM) and Self Test is to detect malfunctions that degrade
or preclude TAS protection.
Page 3-10
NOTE
10609I00.ZIPCDL
KMH 880/KTA 870
Rev 0, October/2000