Wavelength Repeatability - Jasco V-530 Hardware/Function Manual

(3) The baseline flatness is normal if the measurement result is within the following
criterion.
<V-530 criterion>
<V-550/560/570 criterion>

4.4.2 Wavelength Repeatability

Measure the spectrum of the deuterium(D
three times repeatedly to check its repeatability.
(1) Select [Envir] from the main menu to display the [Environment] menu.
(2) From the [Environment] menu, select [Other] to display the [Other] screen.
(3) Set the light source to [D2] (to light only the Deuterium lamp). (Refer to Section 9-7
of the Operations manual.)
(4) Select [Single Beam] from the [Environment] menu to display the [Single Beam]
screen.
(5) Display the [Parameter] screen and set the following parameters.
V-530 measurement parameters
Phtmtrc mode
Response
Start WL
End WL
Data interval
Scan. speed
No. of Cycles
Lower scale
Upper scale
Note: PMT voltage
(6) Measure the single beam spectrum with the sample chamber empty three times to
obtain three D
2
example is shown in Fig 4.4.
(7) The wavelength repeatability is normal if it is within the following criterion.
Criterion: Within ±0.1 nm of the average value of the peak of the emission line
spectrum at 656.1 nm
(8) Display the [Others] screen again and return to the original settings (WI and D2).
Sam
Fast
658 nm
654 nm
0.1 nm
40 nm/min
3
0
100
with instrument. Set accordingly.
varies
lamp spectra with an emission line at 656.1 nm. A measurement
Within ±0.001 Abs (1000 200 nm)
Within ±0.001 Abs (850 200 nm)
) lamp with an emission line at 656.1 nm
2
V-550/560/570
parameters
Phtmtrc mode
Response
Band width
Start WL
End WL
Data interval
Scan. speed
No. of Cycles
Lower scale
Upper scale
HT Voltage
25
measurement
Sam
Fast
0.5 nm
658 nm
654 nm
0.025 nm
10 nm/min
3
0
100
300 V