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in this analysis in an attempt to gain better resolution of
the malfunctioning replaceable units.
since the Processor Logout Analysis program operates under os
control, it can be run concurrently with other operating jobs in a
multiprogramming environment and should
be
run by the operator when
the error log becomes full.
It will be used by the customer engineer
during scheduled preventive maintenance periods to locate units
responsible for intermittent hardware failures.
SYSTEM TEST, CHANNEL TEST, CPU TEST, AND STORAGE TEST PROGRAMS
These programs are stand-alone, model-dependent, diagnostic routines
for customer engineer use.
The System Test performs a functional test
of the hardware system components, including the CPU, the buffer,
storage, all channels, and most locally attached I/O devices.
The
2701 Data Adapter Unit and the 2702 and 2703 Transmission Control Units
are supported in wrap or diagnostic mode only (no outboard operations
to remote terminals>.
The storage Test performs a functional test
of processor storage, buffer storage, and the buffer directory.
The
Channel Test performs a detailed diagnosis of 2870, 2860, and 2880
channels, while the CPU Test analyzes the CPU in more detail than the
System Test.
The System Test can be used for the following purposes:
1.
To locate a malfunctioning unit in the system.
(The specific
error component within the unit is not identified.>
2.
To determine a working hardware configuration prior to a system
IPL
3.
To verify correct system operation after a malfunctioning unit
has been repaired
These diagnostic tests are designed for simplicity of operation.
They are loaded from cards, tape, or disk and use the system console
for communication purposes.
Users can run the System Test at
appropriate times, for example, prior to IPLing the system for an
extended period of online operation.
MICRODIAGNOSTICS
Microdiagnostics are a set of stand-alone, high-resolution, fault-
locating tests.
A set of resident microdiagnostics is contained on
a magnetic disk cartridge.
They are loaded into WCS from the device
in the system console.
The resident microdiagnostics are designed
to test those parts of the CPU required to load WCS with nonresident
microdiagnostics that are contained on an I/O device (card reader,
tape drive, direct access device>.
Nonresident microdiagnostics are
to be used by customer engineers to locate malfunctioning field-
replaceable units when a solid hardware error exists.
50: 20
RAS SUMMARY
The degree to which an installation benefits from available RAS
features depends in part upon their proper implementation.
It is
desirable for Model 165 users to design a system that includes RAS
features and to become involved in the implementation and use of
maintenance procedures,.
Specifically, the user can:
• Include OLTEP and OLT's in his operating system
85
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