System Test - IBM 5110 Maintenance Information Manual

D
SYSTEM TEST
The system test briefly exercises all I/O devic, attached
to the system that are in a ready state. The test pattern
used for each device appears on the top half of the dis·
play screen while the test is being executed: This test
would normally be run when you are trying to deter-
mine which I/O device is causing the problem. Once
a problem is detected, an attempt should be made to
complete exercising all remaining devices. This will
indicate whether the problem affects only one device
or is common to all.
II
System Test Menu:
0: RUN SYSTEM TEST
1 : DISPLAY TOTALS
2: DISPLAY AND RESET TOTALS
3: SET OPTIONS
4: RETURN TO SYSTEM
0: Run System Test
Pressing the 0 (zero) key and the EXECUTE key runs
the system test with the following preset options:
Enable Stop on Error (set to yes)
Print 10C on Error (set to yes)
Loop on System Test (set to no)
Note: To alter any of these preset options, press
the 3 key (set options) and change the options as
indicated.
DEVICE
SUBDEVICE COMMAND
ERROR CODE
05 00 00
05 00 02
05 00
02 56
05 00 02
72
OD
40 00
OD
40 01
OE
40
04
OE
40 05
OE
40 05 02
OE
40 06
OE
SO'
04
OE
80 05 05
OE
80 06
4-84
1:
Display Totals
The display totals option indicates the device,
subdevice, and command that is causing the problem.
Pressing the 1 key and then the EXECUTE key
displays the following summary table after the test has
been run. The table can occupy more space than can
be displayed on one display screen. Press EXECUTE to
display the balance of the table.
This table displays the number of times a
device/subdevice has been exercised by a given I/O
command. The count column displays the number of
times the device has been exercised correctly only if
there is no error code appearing in that row. If an error
code is shown, it describes the type of error that
occurred; the count column indicates the number of
times that particular error occurred.
For example, device
05
subdevice 00 was exercised
correctly eight times by I/O command 02. However, the
other three times this same I/O command exercised this
device and subdevice it failed one time with a
56
error
code and two times with a 72 error code.
Note: See Error Codes in this section for definitions of
the error codes. The DC (data compare) error can only
appear during system test. The data that was read back
\
did not compare with the data that was written and no /
CRC error occurred. See I/O Control Information for
definitions of the device, subdevice, and command codes.
COUNT
3
8
1
2
2
66
6
1
3
4
3
'<,.,
\
"
/
"
/