Planning; System Structure; Low Demand Mode; High Demand Mode - Pepperl+Fuchs SIL KFD0-SD2-*. Series Safety Manual

Solenoid driver
Table of Contents

Advertisement

SAFETY MANUAL SIL K*D0-SD*-(EX)*.****(.SP), HIC2871

Planning

2
Planning
2.1

System Structure

2.1.1

Low Demand Mode

If there are two loops, one for the standard operation and another one for the
functional safety, then usually the demand rate for the safety loop is assumed to
be less than once per year.
The relevant safety parameters to be verified are:
the PFD
T
the SFF value (Safe Failure Fraction)
the HFT architecture (Hardware Fault Tolerance architecture)
2.1.2

High Demand Mode

If there is only one loop, which combines the standard operation and safety
related operation, then usually the demand rate for this loop is assumed to be
higher than once per year.
The relevant safety parameters to be verified are:
PFH (Probability of dangerous Failure per Hour)
Fault reaction time of the safety system
the SFF value (Safe Failure Fraction)
the HFT architecture (Hardware Fault Tolerance architecture)
2.1.3

Safe Failure Fraction

The safe failure fraction describes the ratio of all safe failures and dangerous
detected failures to the total failure rate.
SFF = (λ
A safe failure fraction as defined in EN 61508 is only relevant for elements or
(sub)systems in a complete safety loop. The device under consideration is always
part of a safety loop but is not regarded as a complete element or subsystem.
For calculating the SIL of a safety loop it is necessary to evaluate the safe failure
fraction of elements, subsystems and the complete system, but not of a single
device.
Nevertheless the SFF of the device is given in this document for reference.
6
value (average Probability of Failure on Demand) and
avg
(proof test interval that has a direct impact on the PFD
proof
+ λ
) / (λ
+ λ
+ λ
s
dd
s
dd
)
du
)
avg

Hide quick links:

Advertisement

Table of Contents
loading

Table of Contents