Analog Devices EVAL-ADuM4138EBZ User Manual
Analog Devices EVAL-ADuM4138EBZ User Manual

Analog Devices EVAL-ADuM4138EBZ User Manual

Evaluating the adum4138 icoupler, high-voltage isolated igbt gate driver with isolated flyback controller

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Evaluating the
ADuM4138

FEATURES

6 A peak drive output capability
Output power device resistance <1 Ω
Test infrastructure for
SPI communication
Miller clamp
Desaturation detection
Two overcurrent protection pins
Two temperature sensor pins
Fault reporting
Two dummy loads

EVALUATION KIT CONTENTS

EVAL-ADuM4138EBZ evaluation board

ADDITIONAL HARDWARE REQUIRED

Variable power supply up to 20 V and up to 1 A
USB-SDP-CABLEZ
required for SPI communication

SUPPORTED iCOUPLER MODELS

ADuM4138
PLEASE SEE THE LAST PAGE FOR AN IMPORTANT
WARNING AND LEGAL TERMS AND CONDITIONS.
EVAL-ADuM4138EBZ
iCoupler, High-Voltage Isolated IGBT Gate Driver with
Isolated Flyback Controller

GENERAL DESCRIPTION

The EVAL-ADuM4138EBZ evaluation board demonstrates the
advanced features of the
in a testing environment. The EVAL-ADuM4138EBZ evaluation
board layout delivers a circuit that is easy to manipulate via jumper
pins. A more optimized layout is possible, which increases the
performance of the system as a whole.
The evaluation board works with the
programming cable to access the secondary side electronically
erasable programmable read-only memory (EEPROM), and
also includes the option to drive the serial peripheral interface
(SPI) bus with any other SPI compatible system. The
CABLEZ
has an internal 5 V regulator. To allow for interfacing, a resistor
divider on the MISO line is included in R21 and R22.
This user guide demonstrates how to use the included
evaluation software for accessing the user trim bits. This user
guide shows how to simulate EEPROM settings, as well as
program bits into nonvolatile memory.

EVALUATION BOARD PHOTOGRAPH

Figure 1. EVAL-ADuM4138EBZ Evaluation Board
Rev. 0 | Page 1 of 18
ADuM4138
while maintaining flexibility
USB-SDP-CABLEZ
operates with a 3.3 V logic supply, while the
User Guide
UG-1194
USB-SDP-
ADuM4138
ADuM4138

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Summary of Contents for Analog Devices EVAL-ADuM4138EBZ

  • Page 1: Features

    ADuM4138 while maintaining flexibility Test infrastructure for in a testing environment. The EVAL-ADuM4138EBZ evaluation SPI communication board layout delivers a circuit that is easy to manipulate via jumper Miller clamp pins. A more optimized layout is possible, which increases the Desaturation detection performance of the system as a whole.
  • Page 2: Table Of Contents

    UG-1194 EVAL-ADuM4138EBZ User Guide TABLE OF CONTENTS     Features ....................1 Register Descriptions ................5     Evaluation Kit Contents ..............1 User Trim Register ................5     Additional Hardware Required ............1 Configuration Trim Register ............5     Supported iCoupler Models ............1 Control Register ................6...
  • Page 3: Setting Up The Evaluation Board

    VI+ pin with a 50 Ω load capable source. If a jumper is in P26, causes a desaturation fault approximately 6 μs after the rising the 50 Ω load is connected. (Note that the EVAL-ADuM4138EBZ edge of an input signal on the VI+ pin.
  • Page 4: Miller Clamp Activation Or Deactivation

    UG-1194 EVAL-ADuM4138EBZ User Guide Temperature Sense Fault Override MILLER CLAMP ACTIVATION OR DEACTIVATION Without remote temperature sensing resistors in place, the TS1 In the stock configuration, P2 is jumpered. In this configuration, and TS2 pins float high, which produces a low temperature the Miller clamp is able to be operated.
  • Page 5: Register Descriptions

    EVAL-ADuM4138EBZ User Guide UG-1194 REGISTER DESCRIPTIONS USER TRIM REGISTER OT_Fault_OP Set OT_Fault_OP to 1 to disable a fault for over temperature. If Table 1. Address 00—User Trim Register Map set to 0, the ADuM4138 issues a fault if the TS1 pin detects an...
  • Page 6: Control Register

    UG-1194 EVAL-ADuM4138EBZ User Guide Table 3. td_OC Blanking Times T_Ramp_OP tblank[10:7] Blanking time (μs) Set to 0 to allow the over current reference voltage to vary with 0000 temperature. The current reference varies by 10% across −40°C 0001 to +175°C. Set to 1 to have the overcurrent reference voltage set 0010 to 2 V (typical) regardless of sensed temperature.
  • Page 7 EVAL-ADuM4138EBZ User Guide UG-1194 ECC1_SNG_ERR memory. The hardware sets this bit back to 0 to indicate that programming has occurred. The write sequence takes a If a single error is detected in the EEPROM stored data, the maximum of 40 ms (maximum) to perform, but may write ECC1_SNG_ERR bit is set to 1 when read.
  • Page 8: Evaluation Software Description

    Read Addr:01 sends two read commands. This is because of the way that the SPI setup operates. The second read command Install SDPdrivers.exe (available from Analog Devices). pushes the data loaded by the first read command to the MISO Install LabVIEW Runtime Engine 2011 or later (available pin.
  • Page 9 EVAL-ADuM4138EBZ User Guide UG-1194 sent to the Addr:00 Output field. If the Sim_Trim bit at Address 10 Write/Read Addr:10 is set to 1, the write affects the operation of the ADuM4138 Click Write/Read Addr:10 to perform a single write comprised with the new settings written by the user.
  • Page 10: Evaluation Software Example Operation

    UG-1194 EVAL-ADuM4138EBZ User Guide EVALUATION SOFTWARE EXAMPLE OPERATION These examples assume that the setup described in the Setting EXAMPLE READ COMMANDS Up the Evaluation Board section is used. To perform a read command, first power up the ADuM4138. WHEN ADUM4138 IS NOT COMMUNICATING Then click the read button of the desired address to be read.
  • Page 11: Example Eeprom Write

    EVAL-ADuM4138EBZ User Guide UG-1194 Figure 10. Address Bits Are Being Read Back EXAMPLE EEPROM WRITE the GAIN_1 EEPROM register is not yet programmed. Note that Sim_Trim is still 1 (see Figure 12). To write data to the EEPROM, the Sim_Trim bit must first be To write Address 00 data to EEPROM, set the Prog Busy field set.
  • Page 12 UG-1194 EVAL-ADuM4138EBZ User Guide Figure 11. Setting the Sim_Trim Bit Figure 12. Writing Example Register Edit Rev. 0 | Page 12 of 18...
  • Page 13 EVAL-ADuM4138EBZ User Guide UG-1194 Figure 13. Programming EEPROM Figure 14. ADuM4138 Showing Programming Complete Rev. 0 | Page 13 of 18...
  • Page 14 UG-1194 EVAL-ADuM4138EBZ User Guide After Prog_Busy reads 0, the EEPROM is programmed. Verify Now power up the ADuM4138, and click all the read buttons. this programming by powering down the ADuM4138 It can then be seen that Bit 0 of GAIN_1 survives a power-up, clicking Read Addr:00.
  • Page 15 EVAL-ADuM4138EBZ User Guide UG-1194 Figure 16. EEPROM Successfully Written Rev. 0 | Page 15 of 18...
  • Page 16: Evaluation Board Schematic

    UG-1194 EVAL-ADuM4138EBZ User Guide EVALUATION BOARD SCHEMATIC Figure 17. EVAL-ADuM4138EBZ Circuit Schematic Rev. 0 | Page 16 of 18...
  • Page 17: Ordering Information

    Not installed Not applicable Not applicable 100 Ω resistor, 0603 ERJ-3EKF1000V Panasonic 49.9 Ω resistor, 0603 ERJ-3EKF49R9V Panasonic Sumida 13 μH primary 1:2 transformer 12322-T235 Sumida Isolated IGBT gate driver ADuM4138BRWZ Analog Devices, Inc. Rev. 0 | Page 17 of 18...
  • Page 18 By using the evaluation board discussed herein (together with any tools, components documentation or support materials, the “Evaluation Board”), you are agreeing to be bound by the terms and conditions set forth below (“Agreement”) unless you have purchased the Evaluation Board, in which case the Analog Devices Standard Terms and Conditions of Sale shall govern. Do not use the Evaluation Board until you have read and agreed to the Agreement.

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