Appendix G-Near Integer Ratios; Test Conditions; Figure 85. ±50 Ppm, 2 Ppm Steps - Silicon Laboratories SI5319 Reference Manual

Si53xx-RM
A G—N
PPENDIX EAR
To provide more details and to provide boundaries with respect to the "Reference vs. Output Frequency" issue
described in Appendix B on page 121, the following study was performed and is presented below.

Test Conditions

 XA/XB External Reference held constant at 38.88 MHz
 Input frequency centered at 155.52 MHz, then scanned.
Scan Ranges and Resolutions:
± 50 ppm with 2 ppm steps

± 200 ppm with 10 ppm steps

± 2000 ppm with 50 ppm steps

 Output frequency always exactly four times the input frequency
Centered at 622.08 MHz

 Jitter values are RMS, integrated from 800 Hz to 80 MHz
1200
1000
800
600
400
200
0
155.51
162
I R
NTEGER ATIOS
38.88 MHz External XA-XB Reference
155.515 155.52
Input Frequency (MHz)
Input Frequency Variation = ±50 ppm
Figure 85. ±50 ppm, 2 ppm Steps
Rev. 0.52
155.525 155.53