Keysight Technologies E8257D Service Manual page 401

Post–Repair Procedures
Post–Repair Procedures Matrix
Table 4-9 Performance Tests: Assemblies A30—A40, AT1, B1, and RF Output Connector
(For Prefixes < xx4928)
Performance Tests
The following performance tests are listed in the order that
they should be performed to minimize changes in test
equipment configurations.
Sub–Harmonic Spurious
Non–Harmonic Spurious
Single–Sideband Phase Noise
EVM and IQ Offset
External Digital Modulation Level Accuracy
Relative to CW
Optional Performance Test
Timebase Aging Rate
Table 4-10 Performance Tests: Assemblies A1—A17 (For prefixes >= xx4928)
Performance Tests
following performance tests are listed in the
order that they should be performed to minimize
changes in test equipment configurations.
Self Check Test
Maximum Leveled Output Power
Maximum Leveled Output Power - Digital Mode
(E8267D Option HBL Only)
Maximum Leveled Output Power - Wide IQ/FM
Mode (E8267D Option H18 Only)
Power Level Accuracy
Internal Pulse Modulation Level Accuracy
(E8257D/E8267D Option UNU, UNW, UNS, or HNS,
and E8663D Only)
Internal Pulse Modulation Rise/Fall Time
(E8257D/E8267D Option UNW, UNS, or HNS,
E8663D Option UNW)
E8257D/67D, E8663D PSG Signal Generators Service Guide
Replaced Assembly
X
The
X X X X X
X X X
X X X
X
X X
X
X
X
X X
X
Replaced Assembly
X X X X X X X
X X X
X
X
X X
X X
X
X
X X X
X X X
X
X
X X
X X
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