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Контрольно-измерительные приборы и оборудование
6-13 [:SENSe] Subsystem
[:SENSe]:PFail <test set>
[:SENSe]:PFail?
Title: PASS/FAIL Test Selection
Description: Selects the active test set to be used in subsequent PASS/FAIL
Parameter: <test set>
Related Command: :CONFigure PFail
Front Panel
Access: Measurements, Pass/Fail Mode, Select Pass/Fail Test
[:SENSe]:PN:OFFSet <integer>
[:SENSe]:PN:OFFSet?
Title: PN Offset
Description: Sets the PN offset. Note that this can only be changed when PN Trigger
Parameter: <integer>
Parameter Type: <integer>
Default Value: 0
Range: 0 to 511
Related Command: [:SENSe]:PN:TRIGger
Front Panel
Access: Setup, PN Setup, Manual PN Offset
6-28
measurements. The <test set> value must correspond to a test set that
is defined in the test set list. To view the list on the instrument, go into
the "Measurement" menu, press the "Pass/Fail Mode" key, and then
press the "Select Pass/Fail Test" submenu. Alternatively, the list can be
retrieved remotely and viewed using the Anritsu Master Software
Tools. The <test set> argument is a 1-based index of the position of the
desired Pass/Fail test set in the instrument's current Pass/Fail test set
list. For example, if the desired Pass/Fail test is the 3rd item on the list
then the value of the <test set> argument would be 3.
When using the query form of the command, the return value is the
currently selected test set number. If there is not a valid test set
selected, the return value is "–1" (negative 1).
is set to "GPS", or "EXT". A return value of the PN offset query is
invalid when PN search type is AUTO.
[:SENSe]:PN:TRIGger?
[:SENSe]:PN:STYPe [:SENSe]:PN:STYPe?
PN: 10580-00341 Rev. C
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Chapter 6 — CDMA Commands
MS2720T PM
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