HP Series 37 Reference Manual page 26

3000 series self test and maintenance mode
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Command Descriptions
Channel
The test may be looped by specifying the desired number of loops in
count. Count
must be an integer
between I and 9999 with I being the default. A space is required before specifing
count. Count
must
be specified whenever a specific channel is selected with
channel.
The failure codes for the TIC/PIC
cards are listed in Appendix A. If a channel is not specified, all channels are tested.
The appropriate test (TIC, PIC, or none) is run for each card installed in the CPU and if a failure occurs,
the failure code is printed on the System Console next to the card description.
The CHANNEL test performs the TIC test and the PIC test.
The TIC test has six sections:
• lnit cher:k. Perform an initialization uf the TIC and tl'st that the registers contain the proper
data.
• Rasic I/O <'::,erations.
Issue ORn, IPOLL, SMSK, and RMSK and venfy that they respond
properly.
.. Port register tesls. Write patterns to registers 0-7 of ports 0-7 and verify the data .
.. Diagnostic loopback using DMA sequencer ROM.
• Initiate PCC tests on all 8 ports.
• Perform DMA data loopback test on all 8 ports.
In addition the console TIC is both speed sensed and communication lines are tested with the local console.
The PIC test has nine sections:
• Init check. Perform an initialization of the PIC and test that the registers contain the proper
data.
• Basic I/O operations. Issue OBII, IPOLL, SMSK, and RMSK and verify that they respond
properly .
.. Test the ABI status register (PIC register
I).
• Test the ABI interrupt and interrupt mask registers (PIC registers 2 and 3, respectively).
• Test PIC registers 4 and 5 using data patterns.
• Test PIC register 6.
• Test PIC register 7.
~
Test PIC registers 8, 9, and A using data patterns.
• Fill ABI FIFO and do DMA to memory and DMA from memory. Test PIC registers associated
with DMA transfers.
Return is to the Test Mode prom pL
NOV 84
3-10

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