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Viewing the Output
1. Touch Math in the menu bar, then Math Setup... in the drop-down menu.
2. Touch the On checkbox for the function you want to view:
SERIAL DATA ANALYZER
Serial Data Analyzer Standard and Optional Capabilities
The Serial Data Analyzer is an instrument designed to provide comprehensive measurement
capabilities for evaluating serial digital signals. In addition to the WaveShape Analysis features in
the standard WaveMaster
analysis, including random and deterministic jitter separation, and direct measurement of periodic
jitter, DDj, and DCD. The SDA also provides the capability to directly measure failed bits and to
indicate their locations in the bit stream.
Please Note the Following:
•
SDA - name of the instrument: Serial Data Analyzer
•
ASDA-J - Advanced Serial Data Analysis package, available only on the SDA
•
SDM - Serial Data Mask testing package, available on WaveMaster, WaveRunner 6000A Series, and WavePro
7000A Series oscilloscopes. Not available on the SDA.
SDA Capabilities
In addition to all the standard WaveMaster
other types of measurements: jitter and eye pattern. The ASDA-J option also adds bit error rate
analysis to the SDA. These measurements are available together in the summary screen, as well
as in individual modes.
Measurements on the SDA are performed on long, continuous acquisitions of the signals under
test. All jitter measurements and all displays are based on times of successive edges of the signal
only; nothing is relative to the trigger. As a result, they are not affected by trigger jitter.
Acquisitions should be long enough to include at least several thousand UI of the signal under
test: 30,000 UI or more is optimal. To see low frequency jitter, it may be desirable to acquire
longer records. Acquisitions can be up to the full available memory depth of the instrument (up to
100M samples with option XXL), which may take considerable time to process.
Serial Data Analysis, which includes mask testing and jitter parameters (Rj, Dj, Tj, DDJ, Pj, DCD),
is standard in the SDA. It is also available with option ASDA-J, which adds a major upgrade in
capability over the standard SDA instrument. The different measurements available with each
configuration are shown in Table 1.
306
, the SDA provides eye pattern testing and comprehensive jitter
scope
scope
measurement functions, the SDA provides two
SDA-OM-E Rev H
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