Status Register Details - Texas Instruments CC2500 TK Manual

Bit Field Name
7:0 AGCTEST[7:0]
Bit Field Name
7:0 TEST2[7:0]
Bit Field Name
7:0 TEST1[7:0]
Bit Field Name
7:2 TEST0[7:2]
1 VCO_SEL_CAL_EN
0 TEST0[0]
32.3

Status Register Details

Bit Field Name
7:0 PARTNUM[7:0]
Bit Field Name
7:0 VERSION[7:0]
0x32 (0xF2): FREQEST – Frequency Offset Estimate from Demodulator
Bit Field Name
7:0 FREQOFF_EST
0x2B: AGCTEST – AGC Test
Reset R/W Description
63 R/W For test only. Do not write to this register.
(0x3F)
0x2C: TEST2 – Various Test Settings
Reset R/W Description
Set to 0x81 for improved sensitivity at data rates ≤100 kBaud. The
136 (0x88) R/W
temperature range is then from 0
0x2D: TEST1 – Various Test Settings
Reset R/W Description
Set to 0x35 for improved sensitivity at data rates ≤100 kBaud. The
49 (0x31) R/W
temperature range is then from 0
0x2E: TEST0 – Various Test Settings
Reset R/W Description
2 (0x02) R/W
The value to use in this register is given by the SmartRF
software [5].
1 R/W Enable VCO selection calibration stage when 1
1 R/W
The value to use in this register is given by the SmartRF
software [5].
0x30 (0xF0): PARTNUM – Chip ID
Reset R/W Description
128 (0x80) R Chip part number
0x31 (0xF1): VERSION – Chip ID
Reset R/W Description
3 (0x03) R Chip version number.
Reset R/W Description
R The estimated frequency offset (2's complement) of the carrier.
Resolution is F
±210 kHz, dependent of XTAL frequency.
Frequency offset compensation is only supported for 2-FSK;
GFSK and MSK modulation. This register will read 0 when
using OOK modulation.
SWRS040C
o o
C to +85 C.
o o
C to +85 C.
14
/2 (1.59 - 1.65 kHz); range is ±202 kHz to
XTAL
CC2500
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Studio
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Studio
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