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System Description
Basic System Configurations
Basic System Configurations
The N5250C can be used in either of two basic configurations, depending on how the test ports
are connected to the device under test (DUT): coaxial measurement configuration or wafer
probe measurement configuration.
Input power to the test ports must not exceed +27 dBm. Input power in excess of
this level will damage expensive components. Observe proper precautions,
especially when measuring amplifiers with gains of 20 dB or greater.
Coaxial Measurement
This configuration is used when the DUT has coaxial connectors. The N5250C test ports have 1.0
mm coaxial connectors, and are designed to cover a frequency range of 10 MHz to 110 GHz.
In this configuration, the test head modules are placed on a work bench in front of the millimeter
head controller.
The DUT is normally connected to the test ports by way of a 1.0 mm coaxial cable (test port
cable). Connect the device to Port 1 (left test head module) directly, and to Port 2 (right test
head module) by way of a test cable. It is also possible to connect the DUT using a test port
cable on each test port, although this configuration will result in greater signal loss.
Do not attempt to connect a test device directly between the two 1.0 mm test ports,
without at least one test port cable. The test head modules will not move freely
enough to allow such a connection to be made safely.
Figure 2-2 on page 2-5
coaxial measurement configuration. The test head modules are placed on the bench top in
front of the PNA and controller.
2-4
shows how the instruments are configured on a work bench for the
PNA Series Microwave Network Analyzer System
Installation and Service Guide N5250-90001
N5250A
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