Deleted Table 3; Added Figure 3, En55022 Radiated Emissions Test Results Section, Table 2, And Table 3; Renumbered Sequentially; En55022 Radiated Emissions Test Results; Changes To Decoupling And Reservoir Capacitors Section - Analog Devices EVAL-ADM2582EEBZ User Manual

EVAL-ADM2582EEBZ/EVAL-ADM2587EEBZ User Guide
Figure 3. Layout Notes for
•
Locate the power delivery circuit in close proximity to the
ADM2582E/ADM2587E
short as possible. The
ADM2587EEBZ
at the bottom of the PCB with a short trace from the
ADP667ARZ
example minimizes the loop area in which high frequency
current can flow. An increase in the loop area results in an
increase in the emissions levels.
Table 2. PCB Stack Up
Primary V Side
CC
Layer 1: Ground 1 plane
Layer 1: Ground 1 plane
Layer 3: V plane
CC
Layer 4: Ground 1 plane
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KEEP OUT AREA
FOR L2 AND L3.
NO GND2 PLANE FILL
ON ANY PCB LAYER.
EVAL-ADM2582EEBZ and EVAL-ADM2587EEBZ
device, so that the V
EVAL-ADM2582EEBZ
PCB has a power delivery circuit located
regulator output to V (Pin 8). This layout
CC
Secondary V Side
ISO
Layer 1: Ground 2 plane
Layer 2: Ground 2 plane
Layer 3: Ground 2 plane (overlap
stitching capacitor)
Layer 4: Ground 2 plane

EN55022 RADIATED EMISSIONS TEST RESULTS

The EVAL-ADM2587EEBZ
certified to pass EN55022 Class B with a >5 dB µV/m margin.
The EVAL-ADM2582EEBZ
to pass EN55022 Class B. EN55022 certification documents for
the EVAL-ADM2582EEBZ
boards are available to users upon request from Analog Devices,
Inc.
Table 3 provides a summary of the capability of the
ADM2582EEBZ
All EN55022 radiated emissions tests are performed with the PCB
schematic and layout, as described in Figure 8 to Figure 13.
Table 3. EN55022 Test Results Summary
Device
ADM2582E
ADM2582E
trace is as
CC
ADM2587E
and EVAL-
ADM2587E
The EVAL-ADM2582EEBZ
boards are configured and tested with 3.3 V V
supplied to the
power supplied from the
(Pin 8). The
standard 9 V battery. All EN55022 radiated emissions testing is
performed with 9 V batteries. Testing is performed at a 500 kbps
clock (ADM2587E) or 16 Mbps clock (ADM2582E), with the
clock supplied by the on-board oscillator. The ADM2582E/
ADM2587E
bus pins are loaded with a 60 Ω termination resistor. Measurements
are carried out in a semi anechoic chamber at 10 m from 30 MHz
to 2 GHz . Figure 4 to Figure 7 show the results of the worst case
horizontal scans, and Table 4 to Table 7 show the tabulated
quasi-peak (QP) results.
Rev. D | Page 5 of 13
evaluation board is tested and
evaluation board is tested and certified
and EVAL-ADM2587EEBZ
and EVAL-ADM2587EEBZ
Configuration EN55022 Class B Result
3.3 V V , 16 Mbps, Pass (with 4.7 dB µV/m
CC
60 Ω load margin)
5.0 V V , 16 Mbps, Pass (with 6.5 dB µV/m
CC
60 Ω load margin)
3.3 V V , 500 kbps, Pass (with 5.5 dB µV/m
CC
60 Ω load margin)
5.0 V V , 500 kbps, Pass (with 8.5 dB µV/m
CC
60 Ω load margin)
and EVAL-ADM2587EEBZ
ADM2582E and ADM2587E
ADP667ARZ regulator output to V
ADP667ARZ regulator input is supplied from a
transceiver is connected in full-duplex mode and the
UG-044
evaluation
EVAL-
evaluation boards.
evaluation
or 5.0 V V power
CC CC
devices, with the
CC