Force Distance Curves - AFM Workshop LS-AFM User Manual

3.2.4 Force/Distance Curves
Force/distance curves are created by measuring the deflection of the cantilever as the sam-
ple is moved towards and then away from the probe at the end of the cantilever. The shape
of a F/D curve depends primarily on the cantilever stiffness and the thickness of a surface
contamination layer. For information about how to analyze F/D curves, see Appendix I.
Measurement of F/D curves is found on the Force-Distance tab.
The AFM must be in feedback in non-vibrating mode before a F/D curve is measured. There
are three important parameters that must be set before the F/D curve is measured. They are:
Down: The distance in nanometers that
1.
the sample will be moved away from
the probe when the F/D curve measure-
ment is initiated.
Up: The distance in nanometers that
2.
the sample will be moved up from the
feedback position during the F/D curve.
During this part of the curve, the probe
is touching the sample surface.
Rate: The rate or velocity of the sample
3.
as it is moved towards and away from
the probe.
V 1.1 / LS-AFM Users Guide
Section 3-13