Tip Retract; Scan; System Window - AFM Workshop LS-AFM User Manual

3.2.2.6 Tip Retract

After scanning a sample, this function is used to move
the tip away from the surface. The Tip Retract function
should always be used to assure that the probe does not
get damaged after scanning.

3.2.2.7 Scan

These buttons allow the user to start and stop scans.

3.2.3 System Window

The system tab has several parameters that control the functionality of the TT-2 AFM. These
parameters should not be changed without a detailed understanding of the function that is
being modified. Incorrect use of the system functions can damage the TT-2 AFM.
System tab in vibrating mode
System tab in non-vibrating mode
V 1.1 / LS-AFM Users Guide
Section 3-10