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4.7 *CHECK* Messages (Alphabetical Listing)
Message
Battery Low
Comm Error 1 (or 2)
Data Log Integrity
Instrument Not Calibrated
Low Power Transient
Parameter Setup
Probe Signal High (or Low)
RAM Fault
SRAM Fault
Temp Signal High (or Low)
16116Maintenance.fm
Alarm 1 and Alarm 2 are automatically cleared and inhibited in the presence
of certain CHECK alarms. If Alarm 1 or Alarm 2 is already active during these
alarms, its state is cleared.
Table 9
Description
The instrument continuously monitors its on-board 3.0 Volt Lithium battery. This
battery is used for the clock and optional SRAM. This message appears for as long
as the battery voltage is below 2.5 volts.
This message indicates a transmission/reception problem with the serial
communications (data log/communications option only).
ERROR 1ERROR 2:
Baud rateCRC error
Parity checkIllegal function
Framing error
Noise error
During power on, the instrument data log is checked for integrity. If errors are found,
the instrument resets the data log and displays this message (data log option only).
The message is cleared by activating any of the front panel icons. Data logging
resumes if the "Ctrl" parameter is "On."
This message will continue to display until the instrument has first been ZERO and
then SPAN calibrated.
This message is caused by the activation of the low-power detection circuit. The
instrument traps low-power transient events in order to prevent corruption of the
internal EEPROM and external SRAM data records. Activation of any icon will clear
this error, otherwise the system will clear the fault 1 minute later.
During power on, the instrument EEPROM is checked for integrity. If errors are
found, the instrument resets parameters back to factory default values and displays
this message. The message is cleared by activating any of the four front panel
icons. The operator should then restore desired parameters and readjust any
analog outputs that may have been previously adjusted.
This message is displayed as long as readings of the probe are too high or too low
and thereby cause the input amplifier to be over-ranged. The error message should
be cleared when it has been autoranged during SPAN calibration. If the message
does not clear, reset the instrument to the factory default values (see
page
60) and perform zero and span calibration. If this does not correct the
problem, perform the calibrations again with the simulated inputs (see
on page
57).
The instrument performs a read-write test on its 1K RAM at power on, and every
four minutes thereafter. If any byte of this RAM is found defective, the instrument
displays this message. This message can only be cleared by a completely
successful test.
This fault is caused by the failure of the optional external SRAM during power on
reset. During the all-segments-on phase of the display test, the lower LCD line
should match the upper line (solid block characters). In the presence of this fault
the lower line of the LCD may display differently than the top line. If this fault occurs,
contact the factory service department.
This message is displayed as long as readings of probe thermistor are too high or
too low. If this occurs, first perform the thermistor output test (see
page
53). If the probe thermistor appears to be correct, contact the manufacturer
for repair.
A temperature-related system error can be avoided or resolved by merely
connecting it to a sensor probe. The probe does not have to be submerged.
section 4.2.4 on
*CHECK* Messages (Alphabetical Listing)
Section 4
section 4.8 on
section 4.6
Page 59
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