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Applications
Material measurements
85070E High-Temperature Dielectric Probe Kit
The 85070E enables measurements of the dielectric properties
of materials quickly and conveniently. Measurements made with
this probe are nondestructive and require no sample preparation.
The dielectric probe is well suited for measurements of liquid,
semisolid and flat solid materials. Measurement results can be
viewed in a variety of formats (ε'r, ε"r, tan δ or Cole-Cole). The
supplied software can be run in the PNA analyzer or on a PC.
85071E Materials Measurement Software
The 85071E materials measurement software calculates the per-
mittivity and permeability of material samples placed in a coaxial
airline or a rectangular waveguide. The measurement technique
works well for solid materials that can be machined to fit precisely
inside a transmission line. Measurement results can be viewed
in a variety of formats (ε'r, εr, µ'r, µ"r, tan δ, or Cole-Cole µ). The
software can be run in the PNA analyzer or on a PC.
Signal integrity measurements
N1930B Physical Layer Test System (PLTS) Software
The PLTS software platform has become an industry standard for
calibration, measurement and analysis of linear passive intercon-
nects such as cables, connectors, backplanes and printed circuit
boards. Utilizing either a vector network analyzer (VNA) or a time
domain reflectometer (TDR), fast and accurate measurements
can be obtained without in-depth knowledge of microwave
measurement techniques. Refer to www.keysight.com/find/plts or
the technical overview, literature number 5989-6841EN for more
details.
Note that there are some test sets that do not follow this numbering scheme such as U3022AE10, U3025AE06,
and U3025AE10, which use solid-state switches, and U3022AS66, which includes 1x6 switching test set and six
calibration distribution ports.
Find us at www.keysight.com
Multiport measurements
Multiport test sets are designed to work with the PNA family of
network analyzers to provide network analysis with a single set
of connections for devices that have multiple ports. The test sets
are configured in a variety of ways, for extension or switching,
electro-mechanical or solid-state switches, number of test ports,
frequency range, and 2- or 4-ports, depending on your analyzer.
Test set types: switching and extension test sets
Switching test sets provide an economical solution for RF
applications. They are connected directly to the test ports of the
VNA, and a group of test ports share the directional couplers
and receivers in the VNA. An extension test set is connected to
the sources and test receivers through the configurable test set
of the VNA. It features a directional coupler for every test port
and all switching occurs behind the directional couplers, which
provides the ultimate in flexibility, stability, and performance for
RF and microwave applications.
Switch types: electro-mechanical and
solid-state switches
Electro-mechanical switches have less insertion loss, higher
power handling, and a more linear response compared to solid-
state switches. They are recommended for testing active devices,
high-power devices, and devices that require wide dynamic
range. However, they have limited switching life (mostly 5 million
cycles) and long setting times. In contrast, solid-state switches
have unlimited switching life, very fast switching speed and
excellent repeatability. Thus, they are often used for high-volume
S-parameter measurements of passive devices.
Test set model number
Multiport test set model numbers represent the type of test set;
note the numbering scheme below.
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