Binning; Binning Options; Binning Examples; Nested Bins - Protek 9216A User Manual

Chapter
4

Binning

Using the LCR Meter to Sort Components
The 9216A has built in features to aid in component sorting, which is useful for production
testing, incoming inspection, device matching, or tests in which multiple components of
similar value must be measured. The binning feature simplifies parts sorting by eliminat-
ing the need to read the major and minor parameters and then deciding what to do with
the part. The STO and RCL keys allow up to nine binning configurations to be entered
and recalled. The configuration can also be programmed over one of the computer inter-
faces. The 9216A can sort components into as many as ten separate bins-eight pass
bins, a minor parameter failure bin, and a general failure bin. Binning operations can ei-
ther be performed using the keys in the BINS group of keys, over the standard RS232
computer interface

Binning Options

Three different types of binning schemes are supported by the 9216A: Pass/Fail, Over-
lapping, and Sequential.
Overlapping (nested) bins have one nominal value and are sorted in progressively larger
bins (for example, 1%, 2%, 3%, etc.). Sequential bins can have different nominal val-
ues, each separated by a percentage (for example, 0.9*nom, 0.95*nom, 1.0*nom,
1.05*nom, with 5% limits). Alternatively, sequential bins can be set up with a single nom-
inal value and asymmetrical limits (for example, 3% to 1%, 1% to 1%, to 3%). Bin
limits are pairs and can be symmetrical (for example, 2%) or asymmetrical (for example,
5% to 1%).

Binning Examples

Nested Bins

Suppose that batch of 100  resistors are to be sorted according to tolerance. The bins
can be set up for this purpose as follows:
Bin 0:
Bin 1:
Bin 2:
Bin 3:
Bin 8:
Bin 9:
Figure 4-1 illustrates\ this example of nested bins.
Pass/Fail has only two bins; good parts and all others.
99  < R < 101 
98  < R < 99 , 101  < R < 102 
97  < R < 98 , 102  < R < 103 
96  < R < 97 , 103  < R < 104 
QDR (quality deficiency report) failure (if Q is too high)
General failure bin (parts not falling into any other bin)
33
(1%)
(2%)
(3%)
(4%)