Stanford Research Systems SR810 Manual page 126

Performance Tests
SR810 Performance Test Record
5. Amplitude Linearity
Sensitivity
1 V
6. Frequency Accuracy
Input Frequency
10 kHz
7. Phase Accuracy
Frequency
10 Hz
100 Hz
1 kHz
10 kHz
8. Sine Output Amplitude and Flatness
Sensitivity Sine Output Ampl.
1 V
200 mV
50 mV
10 mV
Sine Ampl.
1.000 Vrms
9. DC Outputs and Inputs
Output
CH1
Calibrator Ampl. Lower Limit
1.0000 Vrms 0.9900 V
100.00 mVrms 0.0990 V
10.000 mVrms 0.0098 V
Lower Limit
9.990 kHz
Lower Limit
-0.0175V
-0.0175 V
-0.0175 V
-0.0175 V
Lower Limit
1.000 Vrms
0.200 Vrms 196.00 mV
0.050 Vrms 49.000 mV
0.010 Vrms
Frequency Lower Limit
24 kHz
48 kHz
72 kHz
96 kHz
Offset Lower Limit
-100.00
-50.00
0.00
50.00
100.00
Reading
_______
_______
_______
Reading Upper Limit
_______
Reading Upper Limit
_______
_______
_______
_______
Reading
0.9800 V _______
_______
_______
9.800 mV _______
Reading
0.9800 V _______
0.9800 V _______
0.9800 V _______
0.9800 V _______
Reading
9.960 V _______
4.960 V _______
-0.020 V _______
-5.040 V _______
-10.040 V _______
6-18
Upper Limit
1.0100 V
0.1010 V
0.0102 V
10.010 kHz
+0.0175 V
+0.0175 V
+0.0175 V
+0.0175 V
Upper Limit
1.0200 V
204.00 mV
51.000 mV
10.200 mV
Upper Limit
1.0200 V
1.0200 V
1.0200 V
1.0200 V
Upper Limit
10.040 V
5.040 V
0.020 V
-4.960 V
-9.960 V