National Instruments NI 6115/6120 User Manual page 115

Multifunction i/o devices for pci/pxi/compactpci bus computers
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Glossary
rise time
rms
RTD
RTSI bus
RTSI_OSC
S
s
S
S/s
SCANCLK
scatter-gather
signal conditioning
SFDR
SISOURCE
SOURCE
STARTSCAN
STC
system noise
NI 6115/6120 User Manual
the difference in time between the 10% and 90% points of the step
response of a system
root mean square
resistive temperature detector—a metallic probe that measures
temperature based upon its coefficient of resistivity
real-time system integration bus—the National Instruments timing bus
that connects DAQ devices directly, by means of connectors on top of the
devices for precise synchronization of functions
RTSI Oscillator—RTSI bus master clock
seconds
samples
samples per second—used to express the rate at which a DAQ device
samples an analog signal
scan clock signal
a term that describes very high-speed DMA burst-mode transfers that are
made only by the bus master
the manipulation of signals to prepare them for digitizing
spurious free dynamic range
SI counter clock signal
source signal
start scan signal
system timing controller
a measure of the amount of noise present in an analog circuit or when the
analog inputs are grounded
G-10
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