Sorting Extracted Labels; Reflect In Total Judgement; Editing The Measurement Region - Omron FQ2-S/CH Series User Manual

Sorting Extracted Labels

Set the sort condition and count for extracted labels. You can set the sort condition and the maximum number
of detections for detection results.
− [Inspection] −
[Inspect]
1
Press [Sorting method].
2
Select the sorting method.
Item Parameter
Measure- Sorting method Area ascending order
ment
parameter

Reflect in Total Judgement

You can specify whether to reflect the judgement results of an inspection item in the overall judgement. (The
default is to reflect them.)
−
[Inspect] [Inspection]

Editing the Measurement Region

This section describes how to edit the measurement regions. You can edit the measurement region in the same
way as for a search region.
Changing the Model Registration Region to a Shape Other Than a Rectangle: p. 151
Important
If the measurement region is changed, perform teaching if required.
p. 203
208
Inspecting with the Labeling Inspection Item
−
[Labeling] [Modify]
Setting
Area descending order (default)
Pos. X ascending order (ascending order of
X coordinate)
Pos. X descending order (descending order
of X coordinate)
Pos. Y ascending order (ascending order of
Y coordinate)
Pos. Y descending order (descending order
of Y coordinate)
− −
[Add item.] [Labeling]
Measurement region
− −
[Details] Tab Page [Meas. Parameter]
Description
Set the condition to use for label number reassignment.
When sorting by X or Y coordinates, the upperleft corner
is the origin.
−
[Details] Tab Page
−
[Output parameter]
FQ2-S/CH User's Manual