Electrical Specifications
2.11.2
V
Overshoot Specification
CC
The processor can tolerate short transient overshoot events where V
voltage when transitioning from a high-to-low current load condition. This overshoot
cannot exceed VID + V
VID). These specifications apply to the processor die voltage as measured across the
VCC_SENSE and VSS_SENSE lands.
Table 2-16. V
Overshoot Specifications
CC
Symbol
V
OS_MAX
T
OS_MAX
Figure 2-5.
V
Overshoot Example Waveform
CC
VID + V
2.11.3
Die Voltage Validation
Core voltage (V
Table 2-16
events that are < 10 ns in duration may be ignored. These measurements of processor
die level overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
Datasheet, Volume 1
(V
OS_MAX
OS_MAX
Parameter
Magnitude of V
overshoot above VID
CCP
Time duration of V
overshoot above VID
CCP
Example Overshoot Waveform
OS
VID
T
: Overshoot time above VID
OS
V
: Overshoot above VID
OS
) overshoot events at the processor must meet the specifications in
CC
when measured across the VCC_SENSE and VSS_SENSE lands. Overshoot
is the maximum allowable overshoot above
Min
Max
—
50
—
25
T
OS
Time
exceeds the VID
CC
Units
Figure
Notes
mV
2-5
µs
2-5
V
OS
31