Die Voltage Validation; Load Current Versus Time; Vcc Overshoot Specifications - Intel Xeon Processor E5-1600 Datasheet

7.8.2

Die Voltage Validation

Core voltage (V
Table 7-15
Overshoot events that are < 10 ns in duration may be ignored. These measurements of
processor die level overshoot should be taken with a 100 MHz bandwidth limited
oscilloscope.
Figure 7-5.

Load Current Versus Time

Notes:
1. The peak current for any 5 second sample does not exceed Icc_max.
2. The average current for any 10 second sample does not exceed the Y value at 10 seconds.
3. The average current for any 20 second period or greater does not exceed Icc_tdc.
4. Turbo performance may be impacted by failing to meet durations specified in this graph. Ensure that the
platform design can handle peak and average current based on the specification.
5. Processor or voltage regulator thermal protection circuitry should not trip for load currents greater than
I
CC_TDC
6. Not 100% tested. Specified by design characterization.
7.8.2.1 V Overshoot Specifications
CC
The processor can tolerate short transient overshoot events where V
voltage when transitioning from a high-to-low current load condition. This overshoot
cannot exceed VID + V
VID). These specifications apply to the processor die voltage as measured across the
VCC_SENSE and VSS_VCC_SENSE lands.
Table 7-15. V Overshoot Specifications (Sheet 1 of 2)
CC
Symbol
V
OS_MAX
Intel® Xeon® Processor E5-1600/E5-2600/E5-4600 Product Families
Datasheet Volume One
) overshoot events at the processor must meet the specifications in
CC
when measured across the VCC_SENSE and VSS_VCC_SENSE lands.
.
(V
OS_MAX
Parameter
Magnitude of V overshoot above VID
CC
is the maximum allowable overshoot above
OS_MAX
Min
exceeds the VID
CC
Max Units Figure Notes
65 mV 7-6
175