Table 10-5 Tam Tests Versus Test Connectors; Table 10-6 . Tam Tests Versus Test Connectors - HP 8560E Service Manual

Table 10-5 TAM Tests versus Test Connectors
Connector
A15J200
A15J400
A15J502
A15J602
A15J901
* Only on A14 assemblies with part numbers 08560-60059,
08560-69059, 08560-60062, 08560-69062.
Chapter 10
Manual Probe
Troubleshooting Test
OFL error voltage
Negative 10 volt supply
Offset lock loop BW DAC
Positive 15 volt supply
Offset lock RF buffer
IF AMP/limiter bias
Offset lock loop buffer D
Offset lock loop buffer C
Sampler bias test
Positive 15 volt supply
Third LO tune voltage
Offset lock loop buffer
600 MHz oscillator bias
Calibrator AGC amp bias
Calibrator ampl adj
3rd LO driver amp
Positive 15 volt supply
Flatness compensation 3
Flatness compensation 2
Flatness compensation 1
SIG ID collector bias (Option 008)
RF gain control test
Revision
External mixer switch
Signal ID switch (Option 008)
Ten volt reference
External mixer bias
Synthesizer Section
Troubleshooting Using the TAM
Measured Signal
Lines
MS6
MS8
MS5,MS7,MS8
MS2
MS4
MS6
MS7
MS8
MS3
MS2
MS3
MS4
MS5
MS6
MS7
MS1, MS8
MS8
MS2
MS5
MS6
MS7
MS1, MS3
MS3
MS1, MS8
MS5, MS6
MS4
MS7
519