Table B-24. Dte With Test Pattern Commands; Table B-25. Remote Tests And At Commands - ADTRAN DSU III AR User Manual

Front Panel
1=2047 PATTERN
2=511 PATTERN
3=STRESS PTRN #1
4=STRESS PTRN #2
5=STRESS PTRN #3
6=STRESS PTRN #4
Front Panel
1=2047 PATTERN
2=511 PATTERN
3=STRESS PTRN #1
4=STRESS PTRN #2
5=STRESS PTRN #3
6=STRESS PTRN #4
7=DATA FROM DTE
61202011L1-1

Table B-24. DTE With Test Pattern Commands

AT Command Description
_T0&T8 Standard 2047 random data pattern.
_T1&T8 Standard 511 random data pattern.
_T2&T8 Stress pattern with alternating high and
low ones densities. Repeated pattern of
100 octets: 1111 1111; followed by 100
octets: 0000 0000.
_T3&T8 Stress pattern with alternating medium
and low ones densities. Repeated pattern
of 100 octets: 0111 1110; followed by 100
octets: 0000 0000.
_T4&T8 Stress pattern with medium ones density.
Continuous series of octets: 0011 0010.
_T5&T8 Stress pattern with low ones density.
Continuous series of octets: 0100 0000.

Table B-25. Remote Tests and AT Commands

AT Command Description
_T0&T7 Standard 2047 random data pattern
_T1&T7 Standard 511 random data pattern
_T2&T7 DDS Stress Pattern #1
_T3&T7 DDS Stress Pattern #2
_T4&T7 DDS Stress Pattern #3
_T5&T7 DDS Stress Pattern #4
&T6 Data from DTE
DSU III AR User Manual
Appendix B. AT Commands
B-11