Chapter 11. Testing and Troubleshooting
DTE With Test Pattern
The DTE with TP (test pattern) test is similar to the DTE O
described previously except the test pattern is generated in the
DSU using the DSU/CSU internal test pattern generator. This test
can be used to detect deficiencies within the internal drivers and
receivers of the DSU III AR. Figure 11-11 illustrates the loopback
point and the data paths for this test.
Test Purpose
A DTE test using a test pattern is used for the following purposes:
•
•
11-18
DTE
Tx
Rx
Verify integrity of the DTE interface.
Verify integrity of connection between DTE and DSU III AR.
DSU III AR User Manual
LOCAL
DSU/CSU
Error
Test Pattern
Inject
Generator
DTE Tx
DTE Rx
Error
Test Pattern
Clear
Detector
Figure 11-11. DTE with Test Pattern
test
NLY
NET Tx
NET Rx
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