Table 13-4. Dte With Test Pattern Commands - ADTRAN DSU IV ESP User Manual

Front Panel
1 - 2047 Pattern
2 - 511 Pattern
3 - Stress Pattern # 1 _T2&T8
4- Stress Pattern # 2
5 - Stress Pattern # 3 _T4&T8
6 - Stress Pattern # 4 _T5&T8
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Table 13-4. DTE With Test Pattern Commands

AT Command
_T0&T8 Standard 2047 random data pattern.
_T1&T8 Standard 511 random data pattern.
Stress pattern with alternating high and
low ones densities. Repeated pattern of
100 octets:
1111 1111, followed by 100 octets:
0000 0000.
_T3&T8 Stress pattern with alternating medium
and low ones densities. Repeated pattern
of 100 octets:
0111 1110, followed by 100 octets:
0000 0000.
Stress pattern with medium ones density.
Continuous series of octets:
0011 0010.
Stress pattern with low ones density.
Continuous series of octets:
0100 0000.
DSU IV ESP User Manual
Chapter 13. Testing and Troubleshooting
Description
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