National Instruments AT-MIO/AI E Series User Manual page 133

Digital I/O
National Instruments Corporation
Appendix A
Dynamic Characteristics
Settling time for full-scale step.......... 10 s to 1 LSB accuracy
Slew rate ........................................... 5 V/ s
Noise ................................................. 60 Vrms, DC to 1 MHz
Stability
Offset temperature coefficient ........... 50 V/ C
Gain temperature coefficient ............. 7.5 ppm/ C
Onboard calibration reference
Level........................................... 5.000 V ( 0.5 mV) (actual value
Temperature coefficient .............. 0.6 ppm/ C max
Long-term stability ..................... 6 ppm/
Number of channels .......................... 8 input/output
Compatibility .................................... TTL/CMOS
Digital logic levels ............
Power-on state................................... Input (High-Z)
Data transfers .................................... Programmed I/O
Specifications for AT-MIO-16XE-10 and AT-AI-16XE-10
stored in EEPROM)
Level
Input low voltage
Input high voltage
Input low current
Input high current
Output low
voltage
(I OL = 24 mA)
Output high
voltage
(I OH = 13 mA)
A-23
1, 000 h
Min Max
0 V 0.8 V
2 V 5 V
— -320 A
— 10 A
— 0.4 V
4.35 V —
AT-MIO/AI E Series User Manual