NXP Semiconductors NAFE33352 User Manual
  1. Manuals
  2. Brands
  3. NXP Semiconductors Manuals
  4. Motherboard
  5. NAFE33352
  6. User manual
NXP Semiconductors NAFE33352 User Manual

NXP Semiconductors NAFE33352 User Manual

Hide thumbs
Table of Contents

Advertisement

Quick Links

Download this manual
UM12180
NAFE33352 evaluation board user manual
Rev. 1.0 — 13 February 2025
Document information
Information
Keywords
Abstract
Content
SPI-bus, NAFE33352, analog front-end, ADC, RTD, TC
The NAFE33352 evaluation board is designed to test NAFE33352, which is a software
configurable universal input/output AFE that meets high-precision measurement and control
requirements for industrial-grade applications. The device is composed of a precision a 14/16/18-
bit DAC and a 16/24-bit ADC, low-drift voltage reference, low-offset drift buffers, high-voltage,
high-precision amplifiers. This evaluation board, along with the LPC54S018 MCU (with custom
firmware) board, provides an easy-to-use evaluation platform.
User manual

Advertisement

Table of Contents
loading
Need help?

Need help?

Do you have a question about the NAFE33352 and is the answer not in the manual?

Questions and answers

Related Manuals for NXP Semiconductors NAFE33352

Summary of Contents for NXP Semiconductors NAFE33352

  • Page 1 SPI-bus, NAFE33352, analog front-end, ADC, RTD, TC Abstract The NAFE33352 evaluation board is designed to test NAFE33352, which is a software configurable universal input/output AFE that meets high-precision measurement and control requirements for industrial-grade applications. The device is composed of a precision a 14/16/18- bit DAC and a 16/24-bit ADC, low-drift voltage reference, low-offset drift buffers, high-voltage, high-precision amplifiers.
  • Page 2 UM12180 NXP Semiconductors NAFE33352 evaluation board user manual CAUTION This device is sensitive to ElectroStatic Discharge (ESD). Therefore care should be taken during transport and handling. You must use a ground strap or touch the PC case or other grounded source before unpacking or handling the hardware.

  • Page 3: Introduction

    NAFE33352 evaluation board user manual 1 Introduction The NAFE33352 evaluation board is designed to test the NAFE33352, which is a software-configurable universal analog input and output (AIO) analog front-end (AFE) that meets high-precision measurement and control requirements of industrial-grade applications.

  • Page 4: Finding The Kit Resources And Information On The Nxp Web Site

    NAFE33352 evaluation board user manual 2 Finding the kit resources and information on the NXP web site NXP Semiconductors provides online resources for this evaluation board and its supported device(s) on http:// www.nxp.com. The information page for the NAFE33352 evaluation board is at https://www.nxp.com/NAFE33352. The information page provides overview information, documentation, software and tools, parametrics, ordering information and a Getting Started tab.

  • Page 5: Getting Ready

    • LPC54S018-EVB MCU evaluation board (from www.nxp.com) 3.4 Power requirements For the NAFE33352 setup, connect the PC to USB port J2 out of the three USB ports J1, J2 and J3 to power up the LPC54S018-EVB MCU evaluation board. UM12180 All information provided in this document is subject to legal disclaimers.

  • Page 6: Getting To Know The Hardware

    NAFE33352 evaluation board user manual 4 Getting to know the hardware 4.1 Kit overview The NAFE33352 evaluation kit includes an NAFE33352 evaluation board, an LPC54S018 evaluation board with custom firmware, and a USB cable. Use the following steps to set up the hardware: 1.

  • Page 7: Kit Featured Components

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 2. NAFE33352 evaluation board paired with LPC54S018-EVB board 4.2 Kit featured components Table 1. NAFE33352 evaluation board main components Device Description Location NAFE33352 SW-configurable universal AIO-AFE U101 MAX13256ATB Transformer driver U303 TGMR-340V6LF Transformer...

  • Page 8: Jumpers

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 4.2.1 Jumpers Table 2. Jumper settings for external power supply (3.75 V, 15.4 V, -15.4 V) Setting Jumper Comment EXT_3V3 J310 pin 1 – 2 External 3.3 V power selection EXT_-15V0 J311 pin 1 – 2...

  • Page 9: Tool Interface (Gui) Description

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 5 Tool interface (GUI) description 1. GUI Installation 2. Unzip the NAFE33352GUI_installer zip file using the a compression utility, such as WinZip, WinRAR or 7z. Two files with type – “Windows Installer Package” and “Application” will be shown.
  • Page 10 UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 7. On central command, write NAFE and click the Windows start button at the bottom left. The NAFEx3352Demo application will be shown. UM12180 All information provided in this document is subject to legal disclaimers.

  • Page 11: Connectivity Check

    GUI the MCU board address, the NAFE part number, and type (low-power or high-speed). 2. In the absence of proper power to the LPC board or the NAFE33352 EVB, the GUI won’t be able to read back the MCU board address or NAFE part number/type. The GUI has dynamic indicator (marked by a red rectangle below the NXP logo) to show the status of the MCU board connectivity.

  • Page 12: Using The Tool

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 5.2 Using the tool 5.2.1 GUI Figure 3. GUI screenshot Opening the GUI will have a default configuration for all parameters. The main blocks present on the GUI are ADC and DAC. The ADC block (yellow) allows the user to select analog input settings: PGA gain, input selection, data rate, sinc filter, channel delay, and so on.
  • Page 13 The peripheral and signal-chain components on both Analog Input/Output channels are selected to meet the accuracy/temperature operating requirements of the NAFE33352. The EVKit schematic is divided into four sections to guide the user through understanding and using the kit.

  • Page 14: Channel Configuration

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 5.2.3 Channel configuration 1. Select the channel gain using the dropdown menu of the programmable gain amplifier (PGA). Figure 5. Analog Input PGA configuration 2. Configure the data rate, SINC filter order, and Settling mode via the corresponding dropdown menu of the ADC.

  • Page 15: Data-Rate Selection

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual • Read the input voltage on Reading Result box. 2. Single-Channel Continuous Reading • Enter the number of samples required in the box and click Continuous Reading. Once Continuous Reading is clicked, a dialog box will open to pick a folder to create a .csv conversion results file on the hard drive with the number of samples requested.

  • Page 16: Dmm View Tab

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Table 4. ADC data rate (system clock: 4.608 MHz) ...continued 5760 400.00 400.00 400.00 400.00 200.00 133.33 100.00 80.00 7680 300.00 300.00 300.00 300.00 150.00 100.00 75.00 60.00 11520 200.00 200.00 200.00 200.00 100.00...

  • Page 17: Sys And Gpio Tab

    This tab provides easy to use blocks to set system level selections like Internal Vs External Reference or Clock, GPIO functionality, and so on. The NAFE33352 includes five GPIOs with dual functionality. The settings that are possible to change are: •...

  • Page 18: Awg Tab

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 9. GPIO matrix 5.2.8 AWG tab The AWG tab provides tools to generate custom waveforms. To create a waveform, adjust the following parameters: • AWGAMP_MAX: This sets the maximum amplitude of the waveform. (Default is 5 V) •...
  • Page 19 UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Waveform_period = 2*(AMPmintomax_time + HILO_time) Waveform_freq = 1/Waveform_period For example: For 18 bits LSB = (25)/2^18 = 95.367 uV If Step_size(Code = 0) = 1024, Amp_max = 12.5 V, Amp_min = -12.5 V then AMPmintomax_steps = 256 If step_period(code=0)=4000, then AMPmintomax_time = 0.064 s...

  • Page 20: Register Reading Tab

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 5.2.9 Register reading tab Figure 12. Registers readback The Register Reading tab enables the user to read main block registers of the device - analog input channels/ system configurations, analog output configuration/status/data, and device serial number for identification. The user can confirm both the AI and AO register configuration done in Main tab by clicking Read in REG Readback tab.

  • Page 21: Check Alarm Status

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 5.2.11 Check alarm status The AIO-AFE provides a flexible and configurable global alarm to allow the user to configure it based on the specific application and needs. Table 6. Alarm and interrupt GLOBAL ALARM ENABLE 0x32\h OVER_TEMP_ALRM Overtemperature warning at 145 °C.

  • Page 22: Reset

    5.2.13 ADC analog input channel configuration and testing NAFE33352 has eight logical channels, which can be configured to route different internal signals (AVDD, HVDD, HVSS, REF_Byp, and so on) and the external signals at AIP and AIN.
  • Page 23 UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 16. Channel configurations It’s possible to read the internal signal in: 1. ADC Single Channel: • Single Reading, • Continuous Reading 2. ADC Multichannel: • Multireading, • Continuous Reading For more details, see Section 5.2.4.

  • Page 24: Single-Channel Single-Reading (Scsr) Example

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 18. ADC Multi-Channel 5.2.14 Single-channel single-reading (SCSR) example Example: Channel#0 is configured to read the internal VHDD signal. Figure 19 The steps to follow are: 1. Select the number of channels as AI Channel #0.

  • Page 25: Single-Channel Continuous-Reading (Sccr) Example

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 19. Single Reading for VHDD 5.2.15 Single-channel continuous-reading (SCCR) example Example: Channel#0 is configured to read the internal VHDD signal. Figure 20 The steps to follow are: 1. Select number of channel as AI Channel #0.
  • Page 26 UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 20. Continuous Reading for VHDD UM12180 All information provided in this document is subject to legal disclaimers. © 2025 NXP B.V. All rights reserved. User manual Rev. 1.0 — 13 February 2025...

  • Page 27: Multichannel Reading (Mcr) Example

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 21. Continuous Reading for VHDD save location 5.2.16 Multichannel reading (MCR) example Example: From Channel#0 to Channel#7 are configured to read VADD(ch0),HVDD(ch1), HVSS(ch2), REF_BYP(ch3), GPIO0-1(ch4), AIP-VCM(ch5),VCM-AIN(ch6),LDO(ch7). The steps to follow are: 1. Select number of channel as AI Channel #0.

  • Page 28: Multichannel Continuous-Reading (Mccr) Example

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 22. Multi-Reading 5.2.17 Multichannel continuous-reading (MCCR) example Example: From Channel#0 to Channel#7 are configured to read the internal VHDD signal VADD,HVDD, HVSS, REF_BYP, GPIO0-1, AIP-VCM,VCM-AIN,LDO. (Figure 25). The steps to follow that are: 1.
  • Page 29 UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 23. Multichannel continuous-reading Figure 24 shows the structure of the csv file, the number of saved channels, and for each channel, the reported voltage measurement with 128 samples (128 rows). UM12180 All information provided in this document is subject to legal disclaimers.

  • Page 30: Dac Analog Output

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 24. Continuous-reading in .csv format 5.2.18 DAC analog output The DAC has AIO mode selection. The user can choose as AIO mode: • High-Z • Voltage Output • Current Output Figure 25. AIO mode When AIO mode is selected high-Z, set Voltage and set Current controls are disabled.

  • Page 31: Voltage Output

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 26. AIO mode in high-Z 5.2.18.1 Voltage output Figure 27 shows the analog output set for Voltage Output (VO) mode: 1. Set Channel. 2. Set DAC equal to 11. 3. Set as insel VCM/VSNS.

  • Page 32: Current Output

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 27. AIO mode - Voltage Output 5.2.18.2 Current output Figure 28 shows the analog output set for Current Output (CO) mode: 1. Set Channel 2. Put DAC equal to 11 3. Set as insel INSNS/VCM 4.

  • Page 33: Save And Load Configuration File

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 28. AIO mode in Current Output 5.2.19 Save and load configuration file The NAFExx3352 GUI provides a user-friendly save-and-load configuration file function This function allows the user to save current AFE channel (#0-8) configurations, SCCR number of samples, MCCR enabled channel, and MCCR number of loops in an .acs (AFE configuration settings) file.

  • Page 34: Load Configuration File

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 29. Save configuration Second, key in a file name (such as test1_save.acs) to save the particular measurement configuration settings in an .acs file to be used for future measurement. Figure 30. Example save file 5.2.19.2 Load configuration file...

  • Page 35: Application Demo

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 32. Load AFE configuration settings 5.3 Application demo In the GUI, it is possible to try four typical applications of the NAFE, divided into the following subtabs: • On Board RTD • External 4W PT100 •...

  • Page 36: On Board Rtd

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 5.3.1 On Board RTD Figure 34. On Board RTD The EVKit features a voltage divider composed of two resistors and one thermistor. The voltage divider is powered by ref_buf output, as shown in the left portion of...

  • Page 37: External 4 W Pt100

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 5.3.2 External 4 W PT100 Figure 36. External 4 W PT100 PT 100 temperature sensors are the most common type of platinum resistance thermometer. PT indicates the sensor is made from Platinum (Pt), 100 means, at 0 °C, the sensor has a resistance of 100 ohms (Ω). The fourwire configuration makes it possible to force a current through two wires and read the voltage on the other two wires.

  • Page 38: Load Cell

    The internal functioning of a load cell differs according to the load cell chosen. There are, for example, hydraulic load cells, pneumatic load cells, and strain-gauge load cells. As shown in Figure 37, a strain-gauge load cell is used as an application example for NAFE33352. In this section is possible to configure: • Sinc filter • Single/Normal-cycle •...
  • Page 39 UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 38. LoadCell_Calibration The calibration process consists of two steps (as shown in the pop-up dialogue window): 1. Offset reset: Remove all weight from the scale and take one measurement. This value will be the value at 0 load, therefore the system offset.
  • Page 40 UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figure 39. Calibration coefficient calculation These two measurements take about 4 to 5 seconds. Pressing ▶ below Start Single conversion will execute a single conversion. Two results will be shown: • Voltage raw result •...

  • Page 41: Input Current

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 5.3.4 Input Current Figure 40. Input Current In this section is possible to configure: • Sinc filter • Single/Normal-cycle • Data rate • Input pin (Sense) • Output current pin (Force) UM12180 All information provided in this document is subject to legal disclaimers.

  • Page 42: References

    NAFE33352 evaluation board user manual 6 References [1] NAFE33352 schematic and jumper location — See NAFE33352_EVB_schematic.pdf. [2] NAFE33352 data sheet — Product specification, function, and register map. UM12180 All information provided in this document is subject to legal disclaimers. © 2025 NXP B.V. All rights reserved.

  • Page 43: Revision History

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual 7 Revision history Table 8. Revision history Document ID Release date Description UM12180 v.1.0 13 February 2025 Initial version UM12180 All information provided in this document is subject to legal disclaimers. © 2025 NXP B.V. All rights reserved.

  • Page 44: Legal Information

    NXP Semiconductors. In the event that customer uses the product for design-in and use in In no event shall NXP Semiconductors be liable for any indirect, incidental, automotive applications to automotive specifications and standards, punitive, special or consequential damages (including - without limitation - customer (a) shall use the product without NXP Semiconductors’...
  • Page 45 UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Tables Tab. 1. NAFE33352 evaluation board main Tab. 4. ADC data rate (system clock: 4.608 MHz) ..15 components ............7 Tab. 5. Generated waveform frequency with HILO Tab. 2. Jumper settings for external power supply time = 0 ............19...
  • Page 46 UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Figures Fig. 1. NAFE33352 evaluation board paired with Fig. 20. Continuous Reading for VHDD ....... 26 LPC54S018-EVB board ........6 Fig. 21. Continuous Reading for VHDD save Fig. 2. NAFE33352 evaluation board paired with location ............

  • Page 47: Table Of Contents

    UM12180 NXP Semiconductors NAFE33352 evaluation board user manual Contents Introduction ............3 Finding the kit resources and information on the NXP web site ....4 Getting ready ........... 5 Kit contents ............5 Assumptions ............5 Minimum system requirements ......5 Power requirements ...........5 Getting to know the hardware ......

Table of Contents