Analog Devices EVAL-ADAQ4380-4 User Manual page 14

User Guide
ACE SOFTWARE OPERATION
EXITING THE SOFTWARE
To exit the software, click File icon on the upper right tab and then
click Close ACE.
DESCRIPTION OF THE ANALYSIS WINDOW
Click Proceed to Analysis in the ADAQ4380-4, ADAQ4370-4,
or ADAQ4381-4 chip view window to open the ADAQ4380-4,
ADAQ4370-4, or ADAQ4381-4 analysis view window, as shown
in Figure 19. The ADAQ4380-4, ADAQ4370-4, or ADAQ4381-4
analysis view window contains the Waveform (see
Histogram (see Figure 22), FFT (see
25), and DNL (see Figure 26) tabs.
In the Device Settings section, click the SDO Mode drop-down
list and select four_wire. Click Run Once to update the register
settings.
CAPTURE Pane
The CAPTURE pane contains the capture settings. These settings
reflect onto the registers automatically before data capture.
In the General Capture Settings section, the Sampling Frequen-
cy (ksps) or Throughput (ksps) field allows the user to set the
throughput rate of the μModule. The ADAQ4380-4, ADAQ4370-4,
or ADAQ4381-4 has a maximum throughput rate of 4/2 MSPS.
By default, the throughput rate is set to 2 MSPS since the SDO
Mode in the Device Settings section is in Two_wire mode. To
change that, click the drop-down list and select four_wire to enable
maximum throughput rate.
In the General Capture Settings section, the Sample Count
drop-down list allows the user to select the number of samples per
capture.
The ADAQ4380-4, ADAQ4370-4, and ADAQ4381-4 have on-chip
oversampling features. In the Device Settings section, click the
Over Sampling Mode drop-down list to select between Normal
Average and Rolling Average oversampling. Click the Over Sam-
pling Ratio drop-down list to enable device oversampling. The
device oversampling section can be set between 2× and 8× for
rolling average oversampling, and between 2× and 32× for nor-
mal average oversampling. For the detailed explanation on the
device on-chip oversampling feature, refer to the ADAQ4380-4,
ADAQ4370-4, or ADAQ4381-4 data sheet.
In the CAPTURE pane, click Run Once to start a data capture
of the samples at the sample rate specified in the Sample Count
drop-down list. These samples are stored on the FPGA device and
are only transferred to the PC when the sample frame is complete.
In the CAPTURE pane, click Run Continuously to start a data
capture that gathers samples continuously with one batch of data at
a time, which runs the Run Once operation continuously.
analog.com
EVAL-ADAQ4380-4/EVAL-ADAQ4370-4/
Figure 21),
Figure 23), INL (see Figure
EVAL-ADAQ4381-4
ANALYSIS Pane
In the ANALYSIS pane, the General Settings section allows the
user to set up the preferred configuration of the FFT analysis.
This configuration sets the number of tones to analyze and if the
fundamental is set manually (see
The Windowing section allows the user to set up the preferred
Window type to use in the FFT analysis. This section also config-
ures the other parameters to include in the analysis (that is, the
Number of Harmonics, Fundamental Bins, Harmonic Bins, DC
Bins, and Worst Other Bins).
The Single Tone Analysis and the Two Tone Analysis sections
set up the fundamental frequencies included in the FFT analysis.
When analyzing one frequency, use the Singe Tone Analysis
section and when analyzing two frequencies, use the Two Tone
Analysis section.
The INL Settings section allows the user to set the Averaging
Iterations and Truncation settings during the INL measurement.
The DNL Settings section allows the user to set the Averaging
Iterations and Truncation settings during the DNL measurement.
RESULTS Pane
The Channels section allows the user to select which channels
to capture. The data for a specific channel is only shown if that
channel is selected before the capture.
The Results section displays amplitude, sample frequency, and
noise analysis data for the selected channels.
Click Export to export captured data. The waveform, histogram,
and FFT data are stored in .xml files along with the values of the
parameters at capture.
Figure 20).
Rev. B | 14 of 20