UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Important notice NXP provides the enclosed product(s) under the following conditions: This evaluation kit is intended for use of ENGINEERING DEVELOPMENT OR EVALUATION PURPOSES ONLY. It is provided as a sample IC pre-soldered to a printed circuit board to make it easier to access inputs, outputs, and supply terminals.
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Getting started The NXP analog product development boards provide an easy-to-use platform for evaluating NXP products. The boards support a range of analog, mixed-signal, and power solutions. They incorporate monolithic integrated circuits and system-in-package devices that use proven high-volume technology.
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board 3.2 Required equipment To use this kit, you need: • Compatible HybridPACK Drive IGBT or SiC MOSFET module • DC link capacitor compatible with the HybridPACK Drive module • 1.27 mm jumpers for configuration (included with kit) •...
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board 4.3 Device features Table 1. Device features Device Description Features GD3160 The GD3160 is an • Compatible with current sense and temp sense advanced single IGBTs channel gate driver for • DESAT detection capability for detecting V IGBT and SiC.
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Figure 2. Connecting FRDM-KL25Z, GD31xx half-bridge EVB and translator board 4.4.1 Low-voltage logic and control connector Low-voltage domain is 12 V VSUP domain that interfaces with the MCU and GD3160 control registers through the 24-pin connector interface.
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Figure 3. Evaluation board voltage and interface domains Table 2. Low-voltage domain 24-pin connector definitions Name Function AOUTL analog output duty cycle encoded signal (low side) for reading temperature via TSENSEA or voltage via AMUXIN n.c.
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Table 2. Low-voltage domain 24-pin connector definitions ...continued Name Function INTAL fault reporting and real time V and VGE monitoring (low side) MOSIH master out slave in (high side) INTAH fault reporting and real time V...
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Table 3. Test point definitions Test point Definition Low-voltage domain VSUP DC voltage source connection point for VSUP power input of GD3160 devices. Typically supplied by vehicle battery +12 V DC. grounding points for low-voltage domain...
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board 4.4.3 Power supply and jumper configuration Figure 5. Power supply and jumper configuration Table 4. Jumper definitions Jumper Position Function PWMHSEL (J10) dead time fault protection enabled (high side) dead time fault protection disabled (use for short-circuit testing)
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Table 4. Jumper definitions ...continued Jumper Position Function MISO normal operation daisy chain operation PS_EN MCU control of flyback supply enable flyback supply enable tied to VSUP 4.4.4 Bottom view Figure 6. Evaluation board bottom view UM11492 All information provided in this document is subject to legal disclaimers.
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board 4.4.5 Gate drive resistors • RGH - gate high resistor in series with the GH pin at the output of the GD3160 gate high driver and HybridPACK Drive module gate that controls the turn-on current for SiC MOSFET gate.
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board 4.4.6 LED interrupt indicators Figure 8. LED interrupt indicators Table 5. LED interrupt indicators Description Low-side INTB connected to the INTB output pin of low-side driver indicating reported fault status when on (active LOW) High-side INTB...
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board 4.5 Kinetis KL25Z Freedom board The Freedom KL25Z is an ultra low-cost development platform for Kinetis L series MCU built on Arm Cortex-M0+ processor. Figure 9. Freedom development platform UM11492 All information provided in this document is subject to legal disclaimers.
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Configuring the hardware FRDMGD3160HBIEVM is connected to compatible SiC MOSFET HybridPACK Drive module with a DC link capacitor as shown in Figure 11. Double pulse and short-circuit testing can be conducted utilizing Windows based PC with FlexGUI software.
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Figure 12. Power module Installation and use of software tools Software for FRDMGD3160HBIEVM is distributed with the FlexGUI tool (available on NXP.com). Necessary firmware comes pre-installed on the FRDM-KL25Z with the kit. Even if the user intends to test with other software or PWM, it is recommended to install this software as a backup or to help debugging.
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board 6.2 Configuring the FRDM-KL25Z microcode Figure 13. FRDM-KL25Z setup and interface By default, the FRDM-KL25Z delivered with this kit is preprogrammed with the current and most up-to-date firmware available for the kit. A way to check quickly that the microcode is programmed and the board is functioning properly, is to plug the KL25Z into the computer, open FlexGUI, and verify that the software version at the bottom is 6.4 or later (see...
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board 8. The FRDM-KL25Z board is now fully set up to work with FRDMGD3160HBIEVM and the FlexGUI. a. There is no software stored or present on either the driver or translator boards, only on the FRDM-KL25Z MCU board.
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board • Access settings by selecting Settings from the File menu. • The Register Map and Tabs settings are shown below: Figure 18. Register map settings Figure 19. Tabs settings UM11492 All information provided in this document is subject to legal disclaimers.
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Command Log window • The Command Log area informs the user about application events. Figure 20. Command Log area Global workspace controls • Always visible in the lower left corner of the main application window.
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board • Pins tab functionality – Set control levels. Default values are shown. – Read and automatically poll INTB pins (INTA pins are added for GD3160). – Control pins set values to a default to a functional state.
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board • Analog tab functionality – Read and poll ADC values from the high-voltage domain – Displays raw ADC and converted values Figure 24. Analog tab functionality Register map • Registers are grouped according to function; independent lines to read and write the registers •...
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Gate Drive tab • Allows setting of parameters related to the gate drive; controls are disabled when not in config mode • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls.
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Figure 27. Current sense tab DESAT & Seg Drive tab • Allows setting of parameters related to desat and segmented drive • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls.
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Overtemperature tab • Allows setting of parameters related to overtemperature and overtemperature warning thresholds • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls.
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Measurements tab • Allows monitoring and graphing of ADC and temperature values Figure 31. Measurements tab Status tab • Allows monitoring of Status 1, Status 2, and Status 3 register values • Status 1 and Status 2 faults can be cleared •...
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Figure 32. Status tab Pulse tab • Used for double pulse, short circuit, and PWM testing • Select desired T1, T2, and T3 timings for each test type; select enable then generate pulses Figure 33. Pulse tab 6.4 Troubleshooting...
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UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Problem Evaluation Explanation Corrective action(s) No PWM output (no fault reported) Check PWM jumper position on Incorrect PWM jumpers obstruct Set PWMH_SEL (J4) and translator board signal path but not report fault PWML_SEL (J5) jumpers properly, for desired control method: •...
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Problem Evaluation Explanation Corrective action(s) SPIERR reported after SPI message Check bit length of message sent There is SPIERR if SCLK does not Use 24-bit message length for SPI see a n*24 multiple of cycles...
UM11492 NXP Semiconductors FRDMGD3160HBIEVM half-bridge evaluation board Revision history Revision history Revision Date Description 20210125 • Figure 11: changed • Figure 12: added • Section 6.2 list item 6a: changed FlexGUI version 20201020 initial version UM11492 All information provided in this document is subject to legal disclaimers.
NXP Semiconductors and its suppliers accept no liability for 10.1 Definitions inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer's own risk.
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