NXP Semiconductors SAFE ASSURE FRDMGD3160HB8EVM User Manual
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NXP Semiconductors SAFE ASSURE FRDMGD3160HB8EVM User Manual

Half-bridge evaluation board
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UM11777
FRDMGD3160HB8EVM half-bridge evaluation board
Rev. 1 — 6 May 2022
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Content
Keywords
automotive, half-bridge, GD3160, gate driver
Abstract
This document describes key features and usage requirements for performing
evaluation of GD3160 gate driver with FRDMGD3160HB8EVM.
User manual

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Summary of Contents for NXP Semiconductors SAFE ASSURE FRDMGD3160HB8EVM

  • Page 1 UM11777 FRDMGD3160HB8EVM half-bridge evaluation board Rev. 1 — 6 May 2022 User manual Document information Information Content Keywords automotive, half-bridge, GD3160, gate driver Abstract This document describes key features and usage requirements for performing evaluation of GD3160 gate driver with FRDMGD3160HB8EVM.
  • Page 2 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Revision history Date Description 20220506 initial version UM11777 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved. User manual Rev. 1 — 6 May 2022...

  • Page 3: Important Notice

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Important notice IMPORTANT NOTICE For engineering development or evaluation purposes only NXP provides the product under the following conditions: This evaluation kit is for use of ENGINEERING DEVELOPMENT OR EVALUATION PURPOSES ONLY. It is provided as a sample IC pre-soldered to a printed-circuit board to make it easier to access inputs, outputs and supply terminals.

  • Page 4: Frdmgd3160Hb8Evm

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board FRDMGD3160HB8EVM Figure 1. FRDMGD3160HB8EVM UM11777 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved. User manual Rev. 1 — 6 May 2022 4 / 39...

  • Page 5: Getting Started

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Getting started NXP analog product development boards provide a platform for evaluating a broad range of NXP analog, mixed-signal, and power solution products. NXP analog product development boards incorporate monolithic integrated circuits and system-in-package devices that use proven high-volume technology.

  • Page 6: Required Equipment

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board 3.2 Required equipment The kit requires the following equipment: • Compatible P6 SiC module • DC link capacitor compatible with the SiC module • 30 µH to 50 µH, high current air core inductor for double pulse testing •...

  • Page 7: Device Features

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board 4.3 Device features Table 1. Device features Device Description Features GD3160 The GD3160 is an • Compatible with current sense and temp sense advanced single IGBTs channel gate driver for • DESAT detection capability for detecting V IGBT and SiC.

  • Page 8: Low-Voltage Logic And Control Connector

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Figure 2. Connecting FRDM-KL25Z, FRDMGD3160HB8EVM and KITGD316xTREVB translator board 4.4.1 Low-voltage logic and control connector The low-voltage domain is 12 V VSUP domain that interfaces with the MCU and GD3160 control registers through the 24-pin connector interface.
  • Page 9 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Figure 3. FRDMGD3160HB8EVM board voltage and interface domains Table 2. Low-voltage domain 24-pin connector definitions Name Function AOUTL analog output duty cycle encoded signal (low side) for reading temperature via TSENSEA or voltage via AMUXIN n.c.

  • Page 10: Test Point Definitions

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Table 2. Low-voltage domain 24-pin connector definitions ...continued Name Function MOSIH master out slave in (high side) n.c. not connected CSBH chip select bar (high side) LED_PWR USB 3.3 V power for INTB LEDs (high side and low side)
  • Page 11 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Table 3. Test point definitions Name Test Point Definition Low-voltage domain grounding point for low-voltage domain VSUP TP26 DC voltage source connection point for VSUP power input of GD3160 devices; typically supplied by vehicle battery +12 V DC...

  • Page 12: Power Supply And Jumper Configuration

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board 4.4.3 Power supply and jumper configuration Figure 5. Power supply and jumper configuration Table 4. Jumper definitions Jumper Position Function PWMALTL_SEL (J4) dead time fault protection enabled (high side) dead time fault protection disabled (use for short-circuit testing) PS_EN (J2) 1–2...

  • Page 13: Bottom View

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Table 5. Power supply definition Component Definition Flyback MOSFET AEC Q101-compliant logic level N-channel MOSFET (Q1) Potentiometer (R32) adjusts resistor R3 for VCCH/VCCL and VEEH/VEEL tune VCC-GNDISO for +17 V 4.4.4 Bottom view Figure 6. FRDMGD3100HB8EVM bottom view UM11777 All information provided in this document is subject to legal disclaimers.

  • Page 14: Gate Drive Resistors

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board 4.4.5 Gate drive resistors • RGH - gate high resistor in series with the GH pin at the output of the GD3160 gate high driver and P6 SiC module gate that controls the turn-on current for SiC MOSFET gate.

  • Page 15: Led Interrupt Indicators

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board 4.4.6 LED interrupt indicators Figure 8. LED interrupt indicators Table 6. LED interrupt indicators Description Low-side INTB connected to the INTB output pin of low-side driver indicating reported fault status when on (active LOW) High-side INTB...

  • Page 16: Kinetis Kl25Z Freedom Board

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board 4.5 Kinetis KL25Z Freedom board The Freedom KL25Z is an ultra low-cost development platform for Kinetis L series MCU built on Arm Cortex-M0+ processor. Figure 9. Freedom development platform UM11777 All information provided in this document is subject to legal disclaimers.

  • Page 17: To 5.0 V Translator Board

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board 4.6 3.3 V to 5.0 V translator board KITGD316xTREVB translator enables level shifting of signals from MCU 3.3 V to 5.0 V SPI communication. Figure 10. Translator board Table 7. Translator board jumper definitions Jumper...
  • Page 18 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Suggested equipment needed for test: • Rogowski coil high-current probe • High-voltage differential voltage probe • High sample rate digital oscilloscope with probes • DC link capacitor • SiC MOSFET P6 module • Windows based PC •...

  • Page 19: Installation And Use Of Software Tools

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Installation and use of software tools Software for FRDMGD3160HB8EVM is distributed with the FlexGUI tool (available on NXP.com). Necessary firmware comes pre-installed on the FRDM-KL25Z with the kit. Even if the user intends to test with other software or PWM, it is recommended to install this software as a backup or to help debugging.

  • Page 20: Using The Flexgui

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board 1. To clear the memory and place the board in boot loader mode, hold down the reset button while plugging a USB cable into the OpenSDA USB port. 2. Verify that the board appears as a BOOTLOADER device and continue with step 3. If the board appears as KL25Z, you may go to step 6.
  • Page 21 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Figure 13. Kit selection FlexGUI settings • Access settings by selecting Settings from the File menu Figure 14. GUI settings menu UM11777 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
  • Page 22 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board • The Loader and Logs settings are shown below: Figure 15. Loader settings Figure 16. Logs settings UM11777 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
  • Page 23 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board • Access settings by selecting Settings from the File menu. • The Register Map and Tabs settings are shown below: Figure 17. Register map settings Figure 18. Tabs settings UM11777 All information provided in this document is subject to legal disclaimers.
  • Page 24 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Command Log window • The Command Log area informs the user about application events. Figure 19. Command Log area UM11777 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
  • Page 25 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Global workspace controls • Always visible in the lower left corner of the main application window. – GD3160 tab functionality – Switch modes between run and configuration mode – Set SPI frequency – Check pin status and clear faults if needed –...
  • Page 26 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board • Status tab functionality – Monitors Status 1 and Status 2 fault bits. Bits that are set are shown in red. – Ability to clear all faults and automatically poll status registers. Figure 22. Status tab functionality •...
  • Page 27 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Register map • Registers are grouped according to function; independent lines to read and write the registers • Individual registers can be read by clicking the R button and can be written by using the W button.
  • Page 28 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Gate Drive tab • Allows setting of parameters related to the gate drive; controls are disabled when not in config mode • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls.
  • Page 29 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Current Sense tab • Allows setting of parameters related to current sense • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls. Figure 26. Current sense tab UM11777 All information provided in this document is subject to legal disclaimers.
  • Page 30 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board DESAT & Seg Drive tab • Allows setting of parameters related to desat and segmented drive • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls.
  • Page 31 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Overtemperature tab • Allows setting of parameters related to overtemperature and overtemperature warning thresholds • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls.
  • Page 32 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Measurements tab • Allows monitoring and graphing of ADC and temperature values Figure 30. Measurements tab UM11777 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
  • Page 33 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Status tab • Allows monitoring of Status 1, Status 2, and Status 3 register values • Status 1 and Status 2 faults can be cleared • Status mask registers can be modified when in configuration mode •...

  • Page 34: Troubleshooting

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board 6.4 Troubleshooting Some common issues and troubleshooting procedures are detailed below. This is not an exhaustive list by any means, and additional debug may be needed: Problem Evaluation Explanation Corrective action(s) No PWM output (no fault reported)

  • Page 35: Schematics, Board Layout, And Bill Of Materials

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Problem Evaluation Explanation Corrective action(s) SPIERR reported after SPI message Check bit length of message sent There is SPIERR if SCLK does not Use 24-bit message length for SPI see a n*24 multiple of cycles...

  • Page 36: Legal Information

    NXP Semiconductors. In no event shall NXP Semiconductors be liable for any indirect, incidental, Evaluation products — This product is provided on an “as is” and “with all punitive, special or consequential damages (including - without limitation - faults”...
  • Page 37 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board NXP — wordmark and logo are trademarks of NXP B.V. 9.3 Trademarks Kinetis — is a trademark of NXP B.V. SafeAssure — is a trademark of NXP B.V. Notice: All referenced brands, product names, service names, and trademarks are the property of their respective owners.
  • Page 38 UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Tables Tab. 1. Device features ..........7 Tab. 4. Jumper definitions ........... 12 Tab. 2. Low-voltage domain 24-pin connector Tab. 5. Power supply definition ........13 definitions ............9 Tab. 6. LED interrupt indicators ........15 Tab.

  • Page 39: Table Of Contents

    UM11777 NXP Semiconductors FRDMGD3160HB8EVM half-bridge evaluation board Contents Important notice ..........3 FRDMGD3160HB8EVM ........4 Getting started ............ 5 Kit contents/packing list ........5 Required equipment .......... 6 System requirements .........6 Getting to know the hardware ......6 Overview ............6 Board features ...........

Table of Contents