NXP Semiconductors FRDMGD3162RPEVM User Manual
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NXP Semiconductors FRDMGD3162RPEVM User Manual

Half-bridge evaluation board
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UM11887
FRDMGD3162RPEVM half-bridge evaluation board
Rev. 1 — 13 February 2023
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Content
Keywords
gate drive, half bridge, RoadPak, GD3162
Abstract
This document describes key features and usage requirements for performing
evaluation of GD3162 gate driver with FRDMGD3162RPEVM.
User manual

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Summary of Contents for NXP Semiconductors FRDMGD3162RPEVM

  • Page 1 FRDMGD3162RPEVM half-bridge evaluation board Rev. 1 — 13 February 2023 User manual Document information Information Content Keywords gate drive, half bridge, RoadPak, GD3162 Abstract This document describes key features and usage requirements for performing evaluation of GD3162 gate driver with FRDMGD3162RPEVM.
  • Page 2 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Revision history Revision Date Description 20230213 initial version UM11887 All information provided in this document is subject to legal disclaimers. © 2023 NXP B.V. All rights reserved. User manual Rev. 1 — 13 February 2023...

  • Page 3: Frdmgd3162Rpevm

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board FRDMGD3162RPEVM Figure 1. FRDMGD3162RPEVM UM11887 All information provided in this document is subject to legal disclaimers. © 2023 NXP B.V. All rights reserved. User manual Rev. 1 — 13 February 2023 3 / 42...

  • Page 4: Important Notice

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Important notice IMPORTANT NOTICE For engineering development or evaluation purposes only NXP provides the product under the following conditions: This evaluation kit is for use of ENGINEERING DEVELOPMENT OR EVALUATION PURPOSES ONLY. It is provided as a sample IC pre-soldere d to a printed-circuit board to make it easier to access inputs, outputs and supply terminals.

  • Page 5: Getting Started

    The tool summary page for FRDMGD3162RPEVM is at http://www.nxp.com/ FRDMGD3162RPEVM. The overview tab provides an overview of the device, product features, a description of the kit contents, a list of (and links to) supported devices, a list of (and links to) any related products, and a Get Started section.

  • Page 6: Required Equipment

    Getting to know the hardware 4.1 Overview The FRDMGD3162RPEVM is a half-bridge evaluation kit populated with two GD3162 single-channel gate drive devices. The kit includes the Freedom KL25Z microcontroller hardware for interfacing a PC installed with FlexGUI software for communication to the Serial Peripheral Interface (SPI) registers on the GD3162 gate drive devices in either daisy chain or standalone configuration.

  • Page 7: Device Features

    • Active Bus Discharge functionality 4.4 Board description The FRDMGD3162RPEVM is a half-bridge evaluation board populated with two GD3162 single channel IGBT or SiC MOSFET gate drive devices. The board supports connection to an FRDM-KL25Z microcontroller for SPI communication configuration programming and monitoring.

  • Page 8: Low-Voltage Logic And Control Connector

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Figure 2. Connecting FRDM-KL25Z, GD31xx half-bridge EVB and translator board 4.4.1 Low-voltage logic and control connector Low-voltage domain requires an externally supplied 12 V VSUP, which supplies an onboard flyback supply for high-side and low-side driver domain VCC/VEE and an on board regulator for low voltage domain 5 V VDD.
  • Page 9 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Figure 3. Evaluation board voltage and interface domains Table 2. Low-voltage domain 24-pin connector definitions Name Function AOUTL analog output duty cycle encoded signal (low side) for reading temperature via TSENSEA or voltage via AMUXIN GS_ENH Gate Strength Enable High –...

  • Page 10: Test Point Definitions

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Table 2. Low-voltage domain 24-pin connector definitions ...continued Name Function MISOH master in slave out (high side) INTAL fault reporting and real time VCE and VGE monitoring (low side) MOSIH master out slave in (high side)
  • Page 11 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Table 3. Test point definitions Test point Definition Low-voltage domain VSUP DC Voltage source connection point for low voltage domain to 5V LDO regulator. Externally supplied 12 V DC supply voltage. Test point for 5V LDO regulator output. Supply voltage for VDD inputs and LED indicator pull-up.

  • Page 12: Power Supply And Jumper Configuration

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board 4.4.3 Power supply and jumper configuration Figure 5. Power supply and jumper configuration Table 4. Jumper definitions Jumper Position Function PWMHSEL (J10) dead time fault protection enabled (high side) dead time fault protection disabled (use for short-circuit testing)

  • Page 13: Bottom View

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board 4.4.4 Bottom view Figure 6. Evaluation board bottom view 4.4.5 Gate drive resistors • RGH_1 – gate high resistor in series with the GH_1 pin at the output of the GD3162 gate high driver and RoadPak module gate that controls the strong turn-on current for SiC MOSFET gate.

  • Page 14: Led Interrupt Indicators

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Figure 7. Gate drive resistors 4.4.6 LED interrupt indicators Figure 8. LED interrupt indicators Table 5. LED interrupt indicators Description Low-side connected to the INTB output pin of low-side driver indicating reported fault status INTB when on (active LOW)

  • Page 15: Kinetis Kl25Z Freedom Board

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board 4.5 Kinetis KL25Z Freedom board The Freedom KL25Z is an ultra low-cost development platform for Kinetis L series MCU built on Arm Cortex-M0+ processor. Figure 9. Freedom development platform UM11887 All information provided in this document is subject to legal disclaimers.

  • Page 16: To 5.0 V Translator Board

    PWM low-side control from KL25Z MCU selects PWM low-side control from fiber optic receiver inputs Configuring the hardware FRDMGD3162RPEVM is connected to compatible SiC MOSFET RoadPak module with a DC link capacitor as shown in Figure 11. Double pulse and short-circuit testing can be conducted utilizing a Windows-based PC with FlexGUI software.

  • Page 17: Installation And Use Of Software Tools

    Figure 11. Evaluation board and system setup Installation and use of software tools Software for the FRDMGD3162RPEVM is distributed with the FlexGUI tool (available on NXP.com). Necessary firmware comes pre-installed on the FRDM-KL25Z with the kit. Even if the user intends to test with other software or PWM, it is recommended to install the software for the FRDMGD3162RPEVM as a backup or to help debugging.

  • Page 18: Installing Flexgui On Your Computer

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board 6.1 Installing FlexGUI on your computer The latest version of FlexGUI supports all versions of GD31xx gate drivers. It is designed to run on any Windows 10 or Windows 8 based operating system. To install the software, do the following: 1.

  • Page 19: Using The Flexgui

    The device may not appear as a distinct device to the computer while connected through the KL25Z USB port, this is normal. 8. The FRDM-KL25Z board is now fully set up to work with FRDMGD3162RPEVM and the FlexGUI. a. There is no software stored or present on either the driver or translator boards, only on the FRDM-KL25Z MCU board.
  • Page 20 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Figure 13. Kit selection FlexGUI settings • Access settings by selecting Settings from the File menu Figure 14. GUI settings menu UM11887 All information provided in this document is subject to legal disclaimers. © 2023 NXP B.V. All rights reserved.
  • Page 21 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board • The Loader and Logs settings are shown below: Figure 15. Loader settings Figure 16. Logs settings UM11887 All information provided in this document is subject to legal disclaimers. © 2023 NXP B.V. All rights reserved.
  • Page 22 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board • Access settings by selecting Settings from the File menu. • The Register Map and Tabs settings are shown below: Figure 17. Register map settings Figure 18. Tabs settings UM11887 All information provided in this document is subject to legal disclaimers.
  • Page 23 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Command Log window • The Command Log area informs the user about application events. Figure 19. Command Log area UM11887 All information provided in this document is subject to legal disclaimers. © 2023 NXP B.V. All rights reserved.
  • Page 24 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Global workspace controls • Always visible in the lower left corner of the main application window. – GD3162 tab functionality – Switch modes between run and configuration mode – Set SPI frequency Figure 20. Device pins settings and status menus UM11887 All information provided in this document is subject to legal disclaimers.
  • Page 25 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board • Pins tab functionality – Set control levels. Default values are shown. – Read and automatically poll INTB pins (INTA pins are added for GD3162). – Control pins set values to a default to a functional state.
  • Page 26 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board • Status tab functionality – Monitors Status 1 and Status 2 fault bits. Bits that are set are shown in red. – Ability to clear all faults and automatically poll status registers. Figure 22. Status tab functionality •...
  • Page 27 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board • Gate strength tab functionality – Read and poll the pull-up and pull-down gate strength that can either be controlled by GSSPI_EN set to logic 1 in MODE2 register and bit settings in config register STATCON4 –...
  • Page 28 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Register map • Registers are grouped according to function; independent lines to read and write the registers • Individual registers can be read by clicking the R button and can be written by using the W button.
  • Page 29 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Gate Drive tab • Allows setting of parameters related to the gate drive; controls are disabled when not in config mode • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls.
  • Page 30 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Current Sense tab • Allows setting of parameters related to current sense • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls. Figure 27. Current sense tab UM11887 All information provided in this document is subject to legal disclaimers.
  • Page 31 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board DESAT & Seg Drive tab • Allows setting of parameters related to desat and segmented drive • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls.
  • Page 32 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Overtemperature tab • Allows setting of parameters related to overtemperature and overtemperature warning thresholds • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls.
  • Page 33 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Undervoltage and overvoltage threshold tab • Allows setting of parameters related to undervoltage and overvoltage threshold • Provides a more intuitive visual way to set parameters • All settings are automatically synchronized with the register controls.
  • Page 34 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Measurements tab • Allows monitoring and graphing of ADC and temperature values Figure 31. Measurements tab UM11887 All information provided in this document is subject to legal disclaimers. © 2023 NXP B.V. All rights reserved.
  • Page 35 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Status tab • Allows monitoring of Status 1, Status 2, and Status 3 register values • Status 1 and Status 2 faults can be cleared • Status mask registers can be modified when in configuration mode •...

  • Page 36: Troubleshooting

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Pulse tab • Used for double pulse, short circuit, and PWM testing • Select desired T1, T2, and T3 timings for each test type; select enable then generate pulses Figure 33. Pulse tab 6.4 Troubleshooting Some common issues and troubleshooting procedures are detailed below.
  • Page 37 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Problem Evaluation Explanation Corrective action(s) No PWM output (fault reported) Check VGE fault (VGE_FLT) A short on IGBT or SiC module gate, Clear VGE_FLT bit (STATUS2) to or too low of VGEMON delay setting continue.

  • Page 38: Schematics, Board Layout, And Bill Of Materials

    The board schematics, board layout, and bill of materials are available at http:// www.nxp.com/FRDMGD3162HBIEVM on the Overview tab under Get Started. References Tool summary page for FRDMGD3162RPEVM http://www.nxp.com/FRDMGD3162HBIEVM Product summary page for GD3162 device http://www.nxp.com/GD3162 UM11887 All information provided in this document is subject to legal disclaimers.

  • Page 39: Legal Information

    NXP Semiconductors. In no event shall NXP Semiconductors be liable for any indirect, incidental, Evaluation products — This product is provided on an “as is” and “with all punitive, special or consequential damages (including - without limitation - faults”...
  • Page 40 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board NXP — wordmark and logo are trademarks of NXP B.V. 9.3 Trademarks Kinetis — is a trademark of NXP B.V. SafeAssure — is a trademark of NXP B.V. Notice: All referenced brands, product names, service names, and trademarks are the property of their respective owners.
  • Page 41 UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Tables Tab. 1. Device features ..........7 Tab. 4. Jumper definitions ........... 12 Tab. 2. Low-voltage domain 24-pin connector Tab. 5. LED interrupt indicators ........14 definitions ............9 Tab. 6. Translator board jumper definitions ....16 Tab.

  • Page 42: Table Of Contents

    UM11887 NXP Semiconductors FRDMGD3162RPEVM half-bridge evaluation board Contents FRDMGD3162RPEVM ..........3 Important notice ..........4 Getting started ............ 5 Kit contents/packing list ........5 Required equipment .......... 6 System requirements .........6 Getting to know the hardware ......6 Overview ............6 Board features ...........

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