Table of Contents
Advertisement
18) Test Parallel Access
A) Internal ROM Parallel Read Access(WORD) .........OK
B) Internal ROM Parallel Write Access(WORD) ........OK
C) Internal ROM Parallel Write Access(High Byte) ...OK
D) Internal ROM Parallel Write Access(Low Byte) ....OK
E) Internal RAM Parallel Read Access(WORD) .........OK
F) Internal RAM Parallel Write Access(WORD) ........OK
G) Internal RAM Parallel Write Access(High Byte) ...OK
H) Internal RAM Parallel Write Access(Low Byte) ....OK
I) Option RAM Parallel Read Access(WORD) ...........SKIP
J) Option RAM Parallel Write Access(WORD) ..........SKIP
K) Option RAM Parallel Write Access(High Byte) .....SKIP
L) Option RAM Parallel Write Access(Low Byte) ......SKIP
19) Test RTC
A) RTC .......................................OK
Tests run for xH:xM:xS
Tests passed, emulator functioning correctly
When –S is added to the command line, step 1 will be executed again after step 19.
22
Shows the check results for the
parallel access controlling
circuits in the E6000 (normal
completion).
Shows the check results for the
RTC controlling circuits in the
E6000 (normal completion).
Shows the check time.
Shows that the E6000 is
correctly operating.
Advertisement
Table of Contents
