Dut Tx Tests - Tektronix TMT4 User Manual

Operation

DUT Tx tests

The Device Under Test (DUT) Transmitter (Tx) tests are optimized to deliver insight into the transmitter path performance of the DUT in
minutes. This section provides the benefits of the test, and an introduction to eye diagrams and link training using the TMT4 Margin Tester.
The DUT Tx test provides a fast look at the eye diagrams of the link formed between the Margin Tester and the DUT. The test also displays
the associated link training parameters used to open the eye. This information enables you to conduct more regular performance checks of
the link and allows you to quickly identify gross errors for any lane and preset combination.
For example, if you want to quickly see the effects of a BIOS change on the health of the link, you can scan the DUT, update the BIOS,
scan the DUT again, and in minutes be able to evaluate the effect those changes had on the link performance.
Eye diagrams
As part of the DUT Tx tests, eye diagrams are shown for each lane and preset combination that represent the error-free region of the link
formed between the DUT and the Margin Tester.
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