Intel ATX 3.0 Design Manual page 14

IEEE* Recommended Practice on Surge Voltages in Low-Voltage AC
Circuits
IEEE Guide on Surge Testing for Equipment Connected to Low-
Voltage AC Power Circuits
Nordic national requirement in addition to EN 60950
American National Standard for Methods of Measurement of Radio-
Noise Emissions from Low-Voltage Electrical and Electronic
Equipment in the Range of 9 kHz to 40 GHz for EMI testing
UL 60950-1 First Edition –CAN/CSA-C22.2 No. 60950-1-03
First Edition,
IEC 60950-1: 2001 + Amendments and National Deviations,
EN 60950-1: 2001 + Amendment A11:
EU Low Voltage Directive (73/23/EEC) (CE Compliance)
GB-4943 (China)
CNS 14336: (Taiwan BSMI)
FCC*, Class B, Part 15 (Radiated and Conducted Emissions)
CISPR* 22 / EN55022, 5th Edition (Radiated and Conducted
Emissions)
EN55024 (ITE Specific Immunity)
EN 61000-4-2 – Electrostatic Discharge
EN 61000-4-3– Radiated RFI Immunity
EN 61000-4-4– Electrical Fast Transients
EN 61000-4-5 – Electrical Surge
EN 61000-4-6 – RF Conducted
EN 61000-4-8 – Power Frequency Magnetic Fields
EN 61000-4-11 – Voltage Dips, Short Interrupts and Fluctuations
EN61000-3-2 (Harmonics)
EN61000-3-3 (Voltage Flicker)
EU EMC Directive ((8/9/336/EEC) (CE Compliance))
IEC 62368
PCI Express* Card Electromechanical Specification Revision 5.0
PCI Express* Card Electromechanical (CEM) Engineering Change
Notice (ECN) – "Power Excursion Limits for 300-600w PCIe* AICs"
PCI Express* Card Electromechanical (CEM) Engineering Change
Request (ECR) – "Power Excursion Limits for up to 300 W PCIe*
AICs"
14
Document
Introduction
Document Number
/Source
ANSI* C62.41-1991
ANSI C62.45-1992
EMKO-TSE (74-SEC)
207/94
ANSI C63.4
PCISIG.com Doc #
15904
PCISIG.com Doc #
16495
PCISIG.com Doc #
16680
336521