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REAL-32, 80, 140, 271
REAL-64, 58, 80, 140, 271
selecting, 80
specifying, 80, 140
vs. reading destination, 81
DC Voltage Measurements, 42
accuracy conditions, 190
changing to 4-wire measurement, 91
CONFigure:VOLTage[:DC], 132 - 133
connecting for, 33
description, 86
MEASure:VOLTage[:DC]?, 148 - 149
percent overrange, 92, 120
range, 92, 120, 172
resolution, 92, 120, 175
specifications, 190
specifying, 86
using autozero, 99
VOLTage[:DC]:RANGe, 172
Declaration of Conformity, 9 - 10
Default Data Format, 271
Definite Length Arbitrary Block, 58, 80
Description, 13
Device Dependent Error Bit, 67
setting in overload, 81
Device Type Register, 206, 224 - 225
DIAGnostic Subsystem, 135
DIAGnostic:FETS, 135
DIAGnostic:FETS?, 135
Digital Bus
cables, 30 - 31, 37 - 38
closing channels, 135
connecting, 30
FET multiplexer control, 135
overview, 31
port, 15
Disabling
autozero, 124, 275
front-panel mainframe keyboard, 39
offset compensation, 165
trigger delay, 182
VME memory card, 152
Discrete Parameters, 119
DISPlay Subsystem, 136 - 138
DISPlay:MONitor:CHANnel, 136
DISPlay:MONitor:CHANnel?, 137
DISPlay:MONitor[:STATe], 137
DISPlay:MONitor[:STATe]?, 138
*DMC, 186
Documentation History, 8
E
282
HP E1326B/E1411B 5 1/2 Digit Multimeter User's Manual Index
Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com
Effective Common Mode, 97
Electrical Description, 14
Embedded Controller
base address, 201
*EMC, 186
*EMC?, 186
Enabling
autorange, 167, 174
autozero, 99, 124, 274
offset compensation, 101, 165
trigger delay, 182
VME memory card, 152
Error
checking for, 66 - 67, 214
codes, 264
codes, list of, 264
codes, reading, 230 - 233
messages, 197 - 198
queue, 19 - 20, 178
*ESE, 186
*ESE?, 186
*ESR?, 186
Example Programs
aborting a measurement, 113
burst measurements, 43 - 46
changing measurement functions, 91
changing the data format, 58 - 59
channel list scanning, 46 - 49
checking for errors, 66 - 67
data format, selecting, 80
entering data into computer, 82
externally triggered burst of measurements, 44
externally triggered scan, 49
maximizing measurement accuracy, 63
maximizing measurement speed, 56 - 57
measurements using single trigger, 112
multimeter self-test, 16
multiple burst measurements, 45
multiple high-speed scans, 54 - 55
multiple paced scans, 48
multiple scans, 47
read/clear error queue, 19
reading an error code, 230 - 233
reading the device type register, 224 - 225
reading the ID register, 223
reading the query response register, 226 - 229
register-based programming, 220 - 261
resetting the multimeter, 221 - 222
retrieving data from memory, 84
saving/recalling configurations, 115
scanning a channel list, 46 - 49
scanning B-size switchbox channels, 50 - 51
scanning C-size switchbox channels, 52 - 53
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