National Instruments DAQ X Series User Manual page 291

hardware-timed
acquisitions
MIO X Series devices, 4-10
Simultaneous MIO X Series devices,
4-44
generations, 5-3, 6-14
hardware-timed single point
acquisitions
MIO X Series devices, 4-11
hardware-timed generations, 5-3, 6-4,
6-14
help, technical support, C-1
hysteresis, analog edge triggering with, 11-6
I
I/O connector, 3-1
NI PCIe/PXIe-6341 pinout, A-5
NI PCIe/PXIe-6361 pinout, A-12
NI PCIe/PXIe-6363 pinout, A-16
NI PCIe-6320 pinout, A-2
NI PCIe-6321 pinout, A-5
NI PCIe-6323/6343 pinout, A-8
NI PCIe-6351 pinout, A-12
NI PCIe-6353 pinout, A-16
NI PXIe-6356/6366 pinout, A-22
NI PXIe-6358/6368 pinout, A-27
NI USB-6341 Screw Terminal pinout,
A-7
NI USB-6343 pinout, A-10
NI USB-6343 Screw Terminal pinout,
A-10
NI USB-6351/6361 Mass Termination
pinout, A-14
NI USB-6351/6361 pinout, A-18, A-24
NI USB-6351/6361 Screw Terminal
pinout, A-13
NI USB-6353/6363 pinout, A-20
NI USB-6356/6366 pinout, A-25
I/O protection, 6-23, 8-7
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implicit buffered
pulse-width measurement, 7-7
semi-period measurement, 7-12
improving analog trigger accuracy, 11-8
input signals
using PFI terminals as, 8-2
using RTSI terminals as, 9-7
insertion of grounded channels between signal
channels (MIO X Series devices), 4-8
installation
hardware, 1-1
NI-DAQ, 1-1
other software, 1-1
instrument drivers (NI resources), C-1
instrumentation amplifier
MIO X Series devices, 4-2
Simultaneous MIO X Series devices, 4-41
interface, bus, 10-1
internal source less than 40 MHz, 7-53
K
KnowledgeBase, C-1
L
LabVIEW documentation, xviii
LabWindows/CVI documentation, xix
LED patterns (USB devices), 3-5
low impedance sources (MIO X Series
devices), 4-7
M
Measurement Studio documentation, xix
measurements
buffered two-signal edge-separation, 7-28
choosing frequency, 7-18
frequency, 7-13
implicit buffered pulse-width, 7-7
implicit buffered semi-period, 7-12
I-9
Index
X Series User Manual