Temperature Test Panel - Analog Devices ADXRS800 User Manual

UG-154

TEMPERATURE TEST PANEL

The Temperature Test panel is designed to let you easily
perform long-term testing at a reduced bandwidth and data
rate. The panel is specifically designed for temperature testing,
with the on-board temperature sensor output plotted alongside
the device rateout, filtered self-test, and quadrature. Each data
point comprises an average of 250 samples, gathered at a 500 Hz
data rate, resulting in a 2 Hz data rate from the device. You can
view and record this information in much the same way as on
the View and Record panel. Data is, again, streamed to a file to
allow for an indefinite length for data recording.
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Figure 19. Temperature Test Panel
Before recording the data on this panel, you can adjust for null
offset components. Note that any offset correction made to the
ADXRS800 is stored in the device EEPROM indefinitely or
until overwritten with a subsequent correction value. Any null
offset corrections made on the View and Record Data panel
persist throughout the evaluation GUI system even when the
device is power cycled.
Supplemental information, including the fault register, sequence
bits, and status bits, is graphically displayed and recorded in
addition to the plotted information you choose to record.
Rev. 0 | Page 10 of 16
Evaluation Board User Guide