Temperature Test Panel - Analog Devices EVAL-ADXRS450Z-M User Manual

Evaluation Board User Guide

TEMPERATURE TEST PANEL

The Temperature Test panel is designed to let you easily
perform long-term testing at a reduced bandwidth and data
rate. The panel is specifically designed for temperature testing,
with the on-board temperature sensor output plotted alongside
the device rateout, filtered self-test, and quadrature. Each data
point comprises an average of 250 samples, gathered at a 500 Hz
data rate, resulting in a 2 Hz data rate from the device. You can
view and record this information in much the same way as on
the View and Record panel. Data is, again, streamed to a file to
allow an indefinite length for data recording.
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Figure 20. Temperature Test Panel
Before recording the data on this panel, you can adjust for null
offset components. Note that any offset correction made to the
ADXRS450/ADXRS453
indefinitely or until overwritten with a subsequent correction
value. Any null offset corrections made on the View and
Record Data panel persist throughout the evaluation GUI
system even when the device is power cycled.
Supplemental information, including the fault register, sequence
bits, and status bits, is graphically displayed and recorded in
addition to the plotted information you choose to record.
Rev. 0 | Page 11 of 20
UG-260
is stored in the device EEPROM