L3 FA5000 Component Maintenance Manual With Illustrated Parts List page 128

Cockpit voice and data recorder
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Table 205. Main Processor Troubleshooting Chart (Continued)
Item
Function Type
ID
UART0 rxD
H027
Power Supply Status
Voltag
e Reg-
ulator
Bank
Power Supply Status
J028 −
Ethernet
Ether-
net In-
ter-
faces
Ethernet
K029
Differential ARINC757
− FDR
(+)
Data
In HI
Differential ARINC757
(+)
K030
Differential ARINC757
− FDR
(−)
Data
In LO
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AVIATION RECORDERS
COMPONENT MAINTENANCE MANUAL
Model FA5000
Failure
Local Effect
Mode
The UART0
There is no
RxD RIPS is
communication
shorted
between the
UART0 and
the internal
RIPS
The Voltage
The Voltage
Regulator
Regulator
Bank is open
Bank fails
The Voltage
The Voltage
Regulator
Regulator
Bank is shor-
Bank fails
ted
The Ethernet
The ethernet
Interface is
MAC port fails
open
to operate in
full−duplex
modes
The Ethernet
The ethernet
Interface is
MAC port fails
shorted
to operate in
full−duplex
modes
Data I/P HI is
Loss of ability
open
to acquire co-
herent FDR
Data Input
(ARINC 757
High)
Data I/P HI is
Loss of ability
shorted
to acquire co-
herent FDR
Data Input
(ARINC 757
High)
Data I/P LO
Loss of ability
is open
to acquire co-
herent FDR
Data Input
(ARINC 757
Low)
Next Effect
End Effect
The MP PWA
Communication is disrupted
has no RIPS
with the RIPS
capability
The CVDR is
The CVDR is unaware
unable to shut
something is wrong
down properly
The CVDR
The CVDR shuts down
shuts down
The CVDR is
The CVDR is unable to per-
unable to per-
form normally but still operates
form normally
but still oper-
ates
The CVDR is
The CVDR is unable to per-
unable to per-
form normally but still operates
form normally
but still oper-
ates
Unable to re-
Unable to record good ARINC
cord good
757 data input from the FPGA
ARINC 757
data input from
the FPGA
Unable to re-
Unable to record good ARINC
cord good
757 data input from the FPGA
ARINC 757
data input from
the FPGA
Unable to re-
Unable to record good ARINC
cord good
757 data input from the FPGA
ARINC 757
data input from
the FPGA
23–70−40
FDR Function Testing & Fault Isolation
Rev. 03 Page 232
Rev.04 Page 232
Feb. 27/13
Mar. 21/14

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