Ebus Dma/Tcr Registers - Sun Microsystems Enterprise 220R Service Manual

Test
line_walk1
pin_test
The following example shows the PCI/Cheerio diagnostic output message.
7.6.4

EBus DMA/TCR Registers

The EBus DMA/TCR registers diagnostic performs the following tests.
Test
DMA_reg_test
DMA_func_test Validates the DMA capabilities and FIFOs. Test is executed in a DMA
The following example shows the EBus DMA/TCR registers diagnostic output
message.
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Sun Enterprise 220R Server Service Manual
Function
Performs walk-one test on interrupt line.
Verifies that the interrupt pin is logic-level high (1) after reset.
Enter (0-11 tests, 12 -Quit, 13 -Menu) ===> 0
Test
vendor_ID_test
device_ID_test
mixmode_read
e2_class_test
status_reg_walk1
line_size_walk1
latency_walk1
line_walk1
pin_test
SUBTEST='pin_test'
Enter (0-11 tests, 12 -Quit, 13 -Menu) ===>
Function
Performs a walking ones bit test for control status register, address
register, and byte count register of each channel. Verifies that the control
status register is set properly.
diagnostic loopback mode. Initializes the data of transmitting memory
with its address, performs a DMA read and write, and verifies that the
data received is correct. Repeats for four channels.
January 2000, Revision A