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SiTime SiT6731EB User Manual

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Table of Contents

Contents
1 Introduction ............................................................................................................................................. 1
2 I/O Descriptions ....................................................................................................................................... 2
3 EVB Usage Descriptions ........................................................................................................................... 2
3.1 EVB Configurations .......................................................................................................................... 2
3.2 Waveform Capturing Using Active Probe ........................................................................................ 3
3.3 Measuring Jitter and Phase Noise ................................................................................................... 3
3.4 Current Measurement ..................................................................................................................... 3
Appendix A .................................................................................................................................................... 4
1

Introduction

The SiT6731EB evaluation board (EVB) is designed for use with SiTime's Emerald OCXOs in the 10-pin
packages. It enables the evaluation of key functionalities of these OCXOs.
EVB Features
-
SMA output for direct connection to measurement equipment
-
Probing points for accurate waveform measurement
-
Provision for future I
-
Connector for current measurement
SiTime typically ships the EVB with the OCXO mounted. The OCXO device should only be evaluated in its
original soldered down state for best signal integrity and frequency stability. For best results the device
should not be de-soldered and then re-soldered either manually or via reflow process.
SiT6731EB Manual Rev. 1.0
SiT6731EB Evaluation Board
User Manual
2
C control interface (connector)
Page 1 of 7
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Summary of Contents for SiTime SiT6731EB

  • Page 1: Table Of Contents

    C control interface (connector) Connector for current measurement SiTime typically ships the EVB with the OCXO mounted. The OCXO device should only be evaluated in its original soldered down state for best signal integrity and frequency stability. For best results the device should not be de-soldered and then re-soldered either manually or via reflow process.

  • Page 2: O Descriptions

    C3 can be adjusted to match the load conditions in the target application. This enables the user to measure waveform characteristics under similar conditions as close to those on the target board as possible. Shipment Configuration SiT6731EB is shipped without components labeled “DNP” on the schematic (see Figure A1 Appendix SiT6731EB Manual Rev. 1.0 Page 2 of 7 www.sitime.com...

  • Page 3: Waveform Capturing Using Active Probe

    Waveform Capturing Using Active Probe SiTime OCXO is a high speed logic output device. It is critical that the proper logic and high frequency measurement techniques are used along with the high quality active probe in order to ensure best measurement results.
  • Page 4 SiT6731EB Evaluation Board User Manual Appendix A Figure A1. SiT6731EB EVB Electrical schematics SiT6731EB Manual Rev. 1.0 Page 4 of 7 www.sitime.com...
  • Page 5 SiT6731EB Evaluation Board User Manual Table A1. Bill of Materials (BOM) Reference Designators Description SMD component size Value Capacitor Case A 10uF Capacitor 0603 0.1uF C3, C4 Capacitors 0603 0603 Green SMA connector J2, J3 SMA connector 3-pin header 5-pin header...
  • Page 6 SiT6731EB Evaluation Board User Manual Probe test points Signal Figure A2. SiT6731EB EVB SiT6731EB Manual Rev. 1.0 Page 6 of 7 www.sitime.com...
  • Page 7 © SiTime Corporation, December 2018. The information contained herein is subject to change at any time without notice. SiTime assumes no responsibility or l iability for any loss, damage or defect of a Product which is caused in whole or in part by (i) use of any circuitry other than circuitry embodied in a SiTime product, (ii) misuse or abuse...

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