System Configuration - Keithley 7072 Instruction Manual

Semiconductor matrix card
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APPLICATIONS
Table 3.2 Crosspoint
Summary for Resistivity
Measurements
Voltage
"I
v2
"3
v4
"5
"6
v7
"!?
T
Sample #l
Al
B4
E3
F2
A4
Bl
E3
F2
A4
83
E2
Fl
A3
B4
E2
Fl
A3
B2
El
F4
A2
03
El
F4
A2
Bl
E4
F3
Al
82
E4
F3
i
Sample #2
A5
B9
El
A8
85
El
A8
81
Eb
Al
B8
Eb
Al
Bb
E5
Ab
B7
E5
A6
BS
E8
A5
Bb
E8
r
Fb
Fb
F5
F5
F8
F8
F7
F7
Crosspoints Closed
-
Sample #3
A9
B12
El1
FlO
Al2
B9
El1
FlO
Al2
Bll
El0
F9
All
B12
El0
F9
All
BlO
E9
F12
Al0
Bll
E9
F12
A10
B9
El2
Fll
A9
BlO
El2
Fll
T
Current
Voltage
Between
Between
l-2
3-4
2-1
3-4
2-3
4-l
3-2
4-1
3-4
1-2
4-3
1-2
4-1
2-3
l-4
2-3
3.5 SEMICONDUCTOR
PARAMETER
ANALYSIS
One or more Model 7072 Semiconductor Matrix Cards can
be used in conjunction
with an HP 41458 Semiconductor
Parameter Analyzer (SPA) to provide a versatile switching
system
capable
of
complete
DC
characterization
of
semiconductors. The following
paragraphs discuss system
configuration, connections using the 7078~CSHP Cable Set,
and SPA measurement considerations.
3.51 System
Configuration
Figure 3-10 shows the general configuration
of the SPA
switching system. The components of the system perform
the following
functions:
HP 4145B: Has four SMUs (Source/Measure Units), two
voltage sources, and two voltage measurement ports. The
unit
can
automatically
run
a variety
of
tests on
semiconductors and plot data on a built-in CRT.
Model 707 Switching
Matrix: Controls the matrix card to
open and close signal paths as required.
Model 7072 Semiconductor Matrix Card: Switches the test
pathways to the device under test. In this particular applica-
tion, three Model 7072 cards provide 3b-pin test capability.
A total of six cards can be installed in a single mainframe,
providing up to 72-pin capability in one mainframe.
System Controller: Controls the SPA and switching matrix
with
user-written
software. Typical
controllers
for this
application
are HP 9000 Series 200 or 300 (with HP-IB
interface),
and IBM
PC, AT or compatible
computers
(equipped with an IEEE-488 interface).
Test Fixture:
Provides the interface between the device
under test and the matrix card. Typically, the test fixture will
be equipped with triax connectors for ease of connections.
3-12

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