Keeping Connectors Clean; Noise Currents Caused By Cable Flexing; Shielding - Keithley 7072 Instruction Manual

Semiconductor matrix card
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OPERATION
2.7.4 Keeping
Connectors
Clean
As is the case with any high-resistance device, the integrity
of biaxial
and other connectors can be damaged if they
are not handled
properly.
If the connector
insulation
becomes contaminated,
the insulation
resistance will be
substantially
reduced, affecting high-impedance
measure-
ment paths.
Oils and salts from the skin can contaminate connector in-
sulators, reducing their resistance. Also, contaminants
pre-
sent in the air can be deposited on the insulator
surface.
To avoid these problems,
never touch the connector in-
sulating material. In addition,
the matrix card should be
used
only
in
clean,
dry
environments
to avoid
contamination.
If the connector insulators should become contaminated,
either by inadvertent
touching, or from ah-borne deposits,
they can be cleaned with a cotton swab dipped in clean
methanol. After thorough cleaning, they should be allow-
ed to dry for several hours in a low-humidity
environment
before use, or they can be dried more quickly using dry
nitrogen.
-
2.7.5 Noise Currents
Caused by Cable Flexing
Noise currents can be generated by bending
or flexing
coaxial or triaxial cables. Such currents, which are known
as triboelectric
currents, are generated by charges created
between a conductor
and insulator
caused by friction.
Low-noise
cable can be used to minimize
these effects.
Such cable has a special graphite coating under the shield
to provide lubrication
and to provide a conduction
path
to equalize charges.
Even low-noise cable generates some noise currents when
flexed or subjected to vibration.
To minimize
these effects,
keep the cables as short as possible, and do not subject
them to temperature variations that could cause expansion
or contraction. Tie down offending cables securely to avoid
movement,
and isolate or remove vibration
sources such
as motors or pumps.
2.7.6 Shielding
Proper shielding of all unguarded signal paths and devices
under test is important
to minimize
noise pickup in vir-
tually
any switching
matrix
system. Otherwise,
inter-
ference from such noise sources as line frequency and RF
fields can seriously
corrupt a measurement.
In order for shielding
to be effective, the shield surround-
ing the HI signal path should be connected to signal LO
(or chassis ground for instruments without isolated Ix) ter-
minals).
Since most Model 7072 matrix applications
call
for separately switching
LO, a separate connection
from
LO to the cable shield at the source or measurement
end
must be provided,
as in the example of Figure 2-21. Here,
we are using the GUARD path of the Model 7072 to carry
the shield out to the device under test. Needless to say,
this arrangement
should not be used with guarding,
as
GUARD and LO should not be connected together.
WARNING
Hazardous voltage may be present if LO on any
instrument
is floated above ground potential.
If the device under test is to be shielded, the shield should
be should be connected to the Lo terminal.
If you are us-
ing the GUARD connection as shield, care should be taken
to insulate the outer ring of the triaxial connector mounted
on the test fixture from the test fixture itself. Otherwise,
Lo will be connected to chassis ground, possibly resulting
in a ground loop. An alternative is to use two shields, one
mounted
within
(and insulated
from) the other. In this
case, the GUARD path would be connected to the inner
shield, while the outer shield would be chassis ground-
ed. This arrangement
is shown in Figure 2-22. Incidental-
ly, this configuration
is also recommended
for guarded ap-
plications,
with the inner shield as guard, and the outer
shield acting as a safety shield.
2-26
I

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