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APPLICATIONS
Figure 3-4. Typical High-frequency
CV Curve Generated by Model 590
3.3 SEMICONDUCTOR
TEST MATRIX
3.3.1 System
Configuration
Two important
advantages of a matrix switching
system
Figure 3-5 shows the configuration
for a typical
multi-
are the ability to connect a variety instruments to the device
purpose semiconductor
test matrix.
Instruments
in the
or devices under test, as well as the ability to connect any
system perform the following
functions.
instrument
terminal to any device test node. The follow-
ing paragraphs discuss a typical semiconductor
matrix test
system and how to use that system to perform a typical
test: common-source characteristic testing of a typical JFET.
3-6
I
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