Table of Contents
Advertisement
I
OPERATION
The connections for electrometer fast amps and resistance
GUARD is again connected to source LO, with source HI
measurements are shown in Figures 2-5(F) and (G). These
and Ix) routed through
two pathways. In the case of the
configurations
are essentially the same as those discussed
guarded current source in (J), card GUARD of the HI signal
above. For the case of fast amps, both GUARD paths are
path is connected
to source GUARD,
and the other
connected to electrometer Lo, while in the case of guarded
GUARD path is connected to source Lo.
resistance, one GUARD path is connected to electrometer
GUARD, and the other GUARD path is connected to elec-
trometer LO.
Source/Measure
Unit Connections
Figure
2-5(J)
shows
typical
connections
for
a
Source Connections
source/measure
unit (SMLJ). In this instance, a remote-
sensing type of a SMU is shown, requiring
a total of four
Voltage and current
source connections
are shown
in
signal pathways to the DUT. For critial measurements, both
Figures 2-5(H) through
(J). The HI and LO paths of the
source and sense HI pathways
would
be guarded
as
voltage source (H) are routed through two jacks, with both
shown, with two of the four card GUARD pathways con-
card GUARD pathways connected to voltage source Lo.
netted to SMU GUARD terminals.
As with other instru-
For the unzuarded
current source connections
(I), card
ment connections, the LO card GUARD pathways are con-
netted to SMU LO terminals.
A.)
DMM Floating
L----J
7072
ROW
COLUMN
L-----f
L-l
Warning : Hazardous voltage from guard
7072
Note : Use this configuration
only fol
source6 may be present on LO.
non-crltlcaf measurements.
B.) DMM Common LO
Figure 2-5. General Instrument
Connections
(A-B)
2-6
Advertisement
Table of Contents
